Efficient X-ray dark field contrast simulations using a condensed history approach

Publication Type:

Journal Article

Authors:

Francken, Nicholas; Jonathan Sanctorum; Ben Huyge; Sijbers, Jan; Jan De Beenhouwer

Source:

Optics Express, Volume 33, Issue 2, p.3562-3576 (2025)

URL:

https://opg.optica.org/oe/fulltext.cfm?uri=oe-33-2-3562&id=567367
Research area: 
X-ray imaging
Tomography