Enhancing industrial inspection with efficient edge illumination x-ray phase contrast simulations

Publication Type:

Conference Paper

Authors:

Francken, Nicholas; Pavel Paramonov; Jan Sijbers; Jan De Beenhouwer

Source:

IEEE EUROCON 2023 -20th International Conference on Smart Technologies, Torino, Italy (2023)
Files: 
PDF icon eurocon_2023.pdf
Research area: 
Tomography