Gratings for multiresolution edge illumination X-ray phase contrast imaging: concept and simulation

Publication Type:

Journal Article

Authors:

Pieter-Jan Vanthienen; Nicholas Francken; Jonathan Sanctorum; Jan Sijbers; Jan De Beenhouwer

Source:

Optics Express, Volume 33, Issue 8, p.17886-17902 (2025)
Research area: 
X-ray imaging
Tomography