Localizing DART using the Reconstructed Residual Error

Publication Type:

Conference Paper

Authors:

Roelandts, Tom; Kees Joost Batenburg; Jan Sijbers

Source:

1st International Conference on Tomography of Materials and Structures (ICTMS), Volume Book of Abstracts: Talks, Ghent, Belgium, p.113-116 (2013)
Files: 
PDF icon Download full paper
Research area: 
X-ray imaging
Tomography