A low-cost and easy-to-use phantom for cone-beam geometry calibration of a tomographic X-ray system

Publication Type:

Conference Paper

Authors:

Van Nguyen; Jan De Beenhouwer; Joaquim Sanctorum; Sam Van Wassenbergh; Peter Aerts; Joris J. J. Dirckx; Jan Sijbers

Source:

9th Conference on Industrial Computed Tomography, Padova, Italy (2019)

URL:

https://www.ndt.net/article/ctc2019/papers/iCT2019_Full_paper_54.pdf
Files: 
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Research area: 
X-ray imaging
Tomography