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A low-cost geometry calibration procedure for a modular cone-beam X-ray CT system
Publication Type:
Journal Article
Authors:
Van Nguyen
;
Jan De Beenhouwer
;
Joaquim Sanctorum
;
Sam Van Wassenbergh
;
Shabab Bazrafkan
;
Joris J. J. Dirckx
;
Jan Sijbers
Source:
Nondestructive Testing and Evaluation , Volume 35, Issue 3, p. 252-265 (2020)
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Research area:
X-ray imaging
Tomography