Modelling of Beam hardening in micro CT

TitleModelling of Beam hardening in micro CT
Publication TypeConference Paper
Year of Publication2003
AuthorsVan de Casteele, E., D. Van Dyck, J. Sijbers, and E. Raman
Conference NameIEEE International Symposium on Biomedical Imaging
Pagination57-58
Date PublishedJuly
Conference LocationWashington DC, USA
Research area: