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Tomography for in-line product inspection
Publication Type:
Patent
Authors:
Thomas De Schryver
;
Manuel Dierick
;
Luc Van Hoorebeke
;
Pieter Verboven
;
Mattias Van Dael
;
Jan Sijbers
Source:
Number EP3106863A1 (2015)
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BibTeX
Research area:
X-ray imaging
Tomography