Publications

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2025
J. De Beenhouwer and Sijbers, J., “A PHASE‑CONTRAST X‑RAY IMAGING SYSTEM FOR OBTAINING A DARK‑FIELD IMAGE AND A METHOD THEREFOR”, U.S. Patent EP 4 351 425 B12025.PDF icon Download patent (547.58 KB)
2024
J. Sijbers and den Dekker, A. J., “Longitudinal Magnetic Resonance Imaging Method”, U.S. Patent WO2024100240A12024.
J. Sijbers, Danckaers, F., and Osstyn, J., “Methods and systems for determining an anatomical reconstruction of a broken bone”, 2024.
2023
J. Sijbers, De Beenhouwer, J., Ling, Y. - T., and Vandervorst, W., “A reconstruction method for atom probe tomography”, U.S. Patent 180175752023.
2017
J. Sijbers and De Beenhouwer, J., “Mobile imaging of an object using penetrating radiation”, U.S. Patent WO/2017/1783342017.
2016
M. Van Dael, Verboven, P., Nicolai, B., Dhaene, J., Van Hoorebeke, L., and Sijbers, J., “Automated quality control and selection ”, U.S. Patent PCT/EP2016/0557182016.
2015
T. De Schryver, Dierick, M., Van Hoorebeke, L., Verboven, P., Van Dael, M., and Sijbers, J., “Tomography for in-line product inspection”, U.S. Patent EP3106863A12015.
T. De Schryver, Dierick, M., Van Hoorebeke, L., Verboven, P., Van Dael, M., and Sijbers, J., “Tomography for in-line product inspection”, U.S. Patent EP3106863A12015.