Publications

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2023
J. Sijbers, De Beenhouwer, J., Ling, Y. - T., and Vandervorst, W., “A reconstruction method for atom probe tomography”, U.S. Patent 180175752023.
2020
S. Verwulgen, Lacko, D., Vleugels, J., Huysmans, T., and Truijen, S., “Brain Computer Interface”, 2020.
S. Verwulgen, Lacko, D., Vleugels, J., Huysmans, T., and Truijen, S., “Brain Computer Interface”, 2020.
2016
M. Van Dael, Verboven, P., Nicolai, B., Dhaene, J., Van Hoorebeke, L., and Sijbers, J., “Automated quality control and selection ”, U.S. Patent PCT/EP2016/0557182016.
M. Van Dael, Verboven, P., Nicolai, B., Dhaene, J., Van Hoorebeke, L., and Sijbers, J., “Automated quality control and selection ”, U.S. Patent PCT/EP2016/0557182016.
M. Van Dael, Verboven, P., Nicolai, B., Dhaene, J., Van Hoorebeke, L., and Sijbers, J., “Automated quality control and selection ”, U.S. Patent PCT/EP2016/0557182016.
T. Huysmans, Sijbers, J., and Verstreken, F., “Orthosis”, U.S. Patent WO/2016/1812822016.
2015
T. De Schryver, Dierick, M., Van Hoorebeke, L., Verboven, P., Van Dael, M., and Sijbers, J., “Tomography for in-line product inspection”, U.S. Patent EP3106863A12015.
T. De Schryver, Dierick, M., Van Hoorebeke, L., Verboven, P., Van Dael, M., and Sijbers, J., “Tomography for in-line product inspection”, U.S. Patent EP3106863A12015.
T. De Schryver, Dierick, M., Van Hoorebeke, L., Verboven, P., Van Dael, M., and Sijbers, J., “Tomography for in-line product inspection”, U.S. Patent EP3106863A12015.