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T. De Schryver, Dierick, M., Van Hoorebeke, L., Verboven, P., Van Dael, M., and Sijbers, J., “Tomography for in-line product inspection”, U.S. Patent EP3106863A12015.
J. De Beenhouwer and Sijbers, J., “A PHASE‑CONTRAST X‑RAY IMAGING SYSTEM FOR OBTAINING A DARK‑FIELD IMAGE AND A METHOD THEREFOR”, U.S. Patent EP 4 351 425 B12025.PDF icon Download patent (547.58 KB)