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J. Gonnissen, De Backer, A., den Dekker, A. J., Martinez, G. T., Rosenauer, A., Sijbers, J., and Van Aert, S., “Optimal experimental design for the detection of light atoms from high-resolution scanning transmission electron microscopy images”, Applied Physics Letters, vol. 105, no. 063116, 2014.
J. Gonnissen, De Backer, A., den Dekker, A. J., Sijbers, J., and Van Aert, S., “Detecting and locating light atoms from high-resolution STEM images: the quest for a single optimal design Ultramicroscopy”, Ultramicroscopy, vol. 170, pp. 128-138, 2016.
J. Gonnissen, De Backer, A., den Dekker, A. J., Sijbers, J., and Van Aert, S., “Atom-counting in High Resolution Electron Microscopy: TEM or STEM - that’s the question”, Ultramicroscopy, vol. 147, pp. 112–120, 2017.
J. Gonnissen, “Optimal statistical experiment design for detecting and locating light atoms using quantitative high resolution (scanning) transmission electron microscopy”, 2017.PDF icon Download thesis (8.1 MB)