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D. Zanaga, Bleichrodt, F., Altantzis, T., Winckelmans, N., Palenstijn, W. J., Sijbers, J., van Nijs, B., van Huis, M. A., van Blaaderen, A., Sánchez-Iglesias, A., Liz-Marzán, L. M., Batenburg, K. J., Bals, S., and Van Tendeloo, G., “Quantitative 3D analysis of huge nanoparticle assemblies”, Nanoscale, vol. 8, no. 1, pp. 292-299, 2015.
D. Zanaga, Bleichrodt, F., Altantzis, T., Winckelmans, N., Palenstijn, W. J., Sijbers, J., de Nijs, B., van Huis, M. A., Sánchez-Iglesias, A., Liz-Marzán, L. M., van Blaaderen, A., Batenburg, K. J., Bals, S., and Van Tendeloo, G., “Quantitative 3D analysis of huge nanoparticle assemblies.”, Nanoscale, vol. 8, no. 1, pp. 292-9, 2016.
D. Zanaga, Altantzis, T., Sanctorum, J., Freitag, B., and Bals, S., “An alternative approach for ζ-factor measurement using pure element nanoparticles”, Ultramicroscopy, vol. 164, pp. 11–16, 2016.