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Conference Paper
Presenti, A., J. Sijbers, A J. den Dekker, and J. De Beenhouwer, "CAD-based defect inspection with optimal view angle selection based on polychromatic X-ray projection images", 9th Conference on Industrial Computed Tomography, Padova, Italy, 2019. PDF icon paper_ict2019_alice.pdf (292.75 KB)
Presenti, A., S. Bazrafkan, J. Sijbers, and J. De Beenhouwer, "Deep learning-based 2D-3D sample pose estimation for X-ray 3DCT", 10th Conference on Industrial Computed Tomography (ICT 2020), 2020.
Presenti, A., J. Sijbers, and J. De Beenhouwer, "Dynamic angle selection for few-view X-ray inspection of CAD based objects", 15th International Meeting on Fully Three-Dimensional Image Reconstruction in Radiology and Nuclear Medicine (Fully3D), vol. 11072, 2019.