Publications

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Journal Article
A. De Backer, van den Bos, K. H. W., Van den Broek, W., Sijbers, J., and Van Aert, S., StatSTEM: An efficient approach for accurate and precise model-based quantification of atomic resolution electron microscopy images, Ultramicroscopy, vol. 171, pp. 104–116, 2016.
J. Fatermans, den Dekker, A. J., Müller-Caspary, K., Lobato, I., O'Leary, C. M., Nellist, P. D., and Van Aert, S., Single Atom Detection from Low Contrast-to-Noise Ratio Electron Microscopy Images, Phys. Rev. Lett., vol. 121, p. 056101, 2018.
J. Gonnissen, De Backer, A., den Dekker, A. J., Martinez, G. T., Rosenauer, A., Sijbers, J., and Van Aert, S., Optimal experimental design for the detection of light atoms from high-resolution scanning transmission electron microscopy images, Applied Physics Letters, vol. 105, no. 063116, 2014.
W. Van den Broek, Rosenauer, A., Sijbers, J., Van Dyck, D., and Van Aert, S., A memory efficient method for fully three-dimensional object reconstruction with HAADF STEM Ultramicroscopy, Ultramicroscopy, vol. 141, pp. 22–31, 2014.
B. Goris, De Beenhouwer, J., De Backer, A., Zanaga, D., Batenburg, K. J., Sánchez-Iglesias, A., Liz-Marzán, L. M., Van Aert, S., Bals, S., Sijbers, J., and Van Tendeloo, G., Measuring Lattice Strain in Three Dimensions through Electron Microscopy, Nano Letters, vol. 15, no. 10, pp. 6996–7001, 2015.
J. Fatermans, Van Aert, S., and den Dekker, A. J., The maximum a posteriori probability rule for atom column detection from HAADF STEM images, Ultramicroscopy, vol. 201, pp. 81-91, 2019.
A. J. den Dekker, Gonnissen, J., De Backer, A., Sijbers, J., and Van Aert, S., Estimation of unknown structure parameters from high-resolution (S)TEM images: what are the limits?, Ultramicroscopy, vol. 134, pp. 34-43, 2013.
J. Gonnissen, De Backer, A., den Dekker, A. J., Sijbers, J., and Van Aert, S., Detecting and locating light atoms from high-resolution STEM images: the quest for a single optimal design Ultramicroscopy, Ultramicroscopy, vol. 170, pp. 128-138, 2016.
J. Gonnissen, De Backer, A., den Dekker, A. J., Sijbers, J., and Van Aert, S., Atom-counting in High Resolution Electron Microscopy: TEM or STEM - that’s the question, Ultramicroscopy, vol. 147, pp. 112–120, 2017.
J. Fatermans, den Dekker, A. J., Müller-Caspary, K., Gauquelin, N., Verbeeck, J., and Van Aert, S., Atom column detection from simultaneously acquired ABF and ADF STEM images, Ultramicroscopy, vol. 219, p. 113046, 2020.
S. Van Aert, De Backer, A., Martinez, G. T., den Dekker, A. J., Van Dyck, D., Bals, S., and Van Tendeloo, G., Advanced electron crystallography through model-based imaging, IUCrJ, vol. 3, 2016.
Conference Abstract
K. J. Batenburg, Bals, S., Van Aert, S., Roelandts, T., and Sijbers, J., Ultra-High Resolution Electron Tomography for Materials Science: A Roadmap, Microscopy and Microanalysis 2011 Meeting. Nashville, TN, United States, 2011.
S. Van Aert, De wael, A., Fatermans, J., Lobato, I., De Backer, A., Jones, L., den Dekker, A. J., and Nellist, P. D., Strategies for quantifying 3D atomic structures of nanomaterials and their dynamics using dose-efficient ADF STEM, PICO2019, Vaalsbroek, The Netherlands. 2019.
S. Van Aert, De wael, A., Fatermans, J., Lobato, I., De Backer, A., Jones, L., den Dekker, A. J., and Nellist, P. D., Quantifying 3D atomic structures of nanomaterials and their dynamics using model-based scanning transmission electron microscopy, Spring Meeting of the EMRS, Nice, France. 2019.
J. Fatermans, den Dekker, A. J., Müller-Caspary, K., Lobato, I., and Van Aert, S., The maximum a posteriori probability rule to detect single atoms from low signal-to-noise ratio scanning transmission electron microscopy images, IMC19, Sydney, Australia. 2018.
S. Van Aert, Fatermans, J., De Backer, A., van den Bos, K. H. W., O'Leary, C. M., Müller-Caspary, K., Jones, L., Lobato, I., Béché, A., den Dekker, A. J., Bals, S., and Nellist, P. D., Maximising dose efficiency in quantitative STEM to reveal the 3D atomic structure of nanomaterials, IMC19, Sydney, Australia. 2018.
B. Goris, De Beenhouwer, J., De Backer, A., Zanaga, D., Batenburg, K. J., Sánchez-Iglesias, A., Liz-Marzán, L. M., Van Aert, S., Sijbers, J., Van Tendeloo, G., and Bals, S., Investigating lattice strain in Au nanodecahedrons, European Microscopy Congress 2016. 2016.
J. Fatermans, Müller-Caspary, K., den Dekker, A. J., and Van Aert, S., Detection of atomic columns from noisy STEM images, Microscopy Conference 2017 (MC 2017), Lausanne, Switzerland. pp. 445-446, 2017.
J. Fatermans, Van Aert, S., and den Dekker, A. J., Bayesian model-order selection in electron microscopy to detect atomic columns in noisy images, RBSM 2016, Brussels, Belgium. p. 53, 2016.
J. Fatermans, den Dekker, A. J., Müller-Caspary, K., Lobato, I., and Van Aert, S., Bayesian analysis of noisy scanning transmission electron microscopy images for single atom detection, SCANDEM 2018, Technical University of Denmark, Kgs. Lyngby, Denmark. p. 95, 2018.
J. Fatermans, den Dekker, A. J., and Van Aert, S., Atom detection from electron microscopy images, RBSM 2019, Louvain-la-Neuve, Belgium. p. 15, 2019.
J. Fatermans, den Dekker, A. J., O'Leary, C. M., Nellist, P. D., and Van Aert, S., Atom column detection from STEM images using the maximum a posteriori probability rule, MC 2019, Berlin, Germany. 2019.
S. Van Aert, De Backer, A., De wael, A., Fatermans, J., Friedrich, T., Lobato, I., O'Leary, C. M., Varambhia, A., Altantzis, T., Jones, L., den Dekker, A. J., Nellist, P. D., and Bals, S., 3D Atomic Scale Quantification of Nanostructures and their Dynamics Using Model-based STEM, Microscopy & Microanalysis 2020 (online), Milwaukee, United States. 2020.