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D
Duijster, A., P. Scheunders, and S. De Backer, "Wavelet-Based EM Algorithm for Multispectral-Image Restoration", IEEE Transactions on Geoscience and Remote Sensing, vol. 47, no. 11, pp. 3892-3898, November, 2009.
Duijster, A., S. De Backer, and P. Scheunders, "Wavelet-based Multispectral Image Restoration", IGARSS 2008 - 2008 IEEE International Geoscience and Remote Sensing Symposium, vol. 3: IEEE International, pp. 79-82, 2008.
Duijster, A., S. De Backer, and P. Scheunders, "Wavelet-based Multicomponent Image Restoration", Wavelet Applications in Industrial Processing V, part of SPIE Optics East, Boston, MA, United States, September 9-12, vol. 6763, October, 2007.
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Elberfeld, T., S. Bazrafkan, J. De Beenhouwer, and J. Sijbers, "Mixed-Scale Dense Convolutional Neural Network based Improvement of Glass Fiber-reinforced Composite CT Images", 4th International Conference on Tomography of Materials & Structures, 07/2019.
Elberfeld, T., J. De Beenhouwer, and J. Sijbers, "Fiber assignment by continuous tracking for parametric fiber reinforced polymer reconstruction", 15th International Meeting on Fully Three-Dimensional Image Reconstruction in Radiology and Nuclear Medicine (Fully3D), vol. 11072, 2019. PDF icon Download paper (5.15 MB)
Elberfeld, T., J. De Beenhouwer, A J. den Dekker, C. Heinzl, and J. Sijbers, "Parametric Reconstruction of Advanced Glass Fiber-reinforced Polymer Composites from X-ray Images", 8th Conference on Industrial Computed Tomography, Wels, Austria, 2018. PDF icon Download paper (636.09 KB)
Elberfeld, T., J. De Beenhouwer, A J. den Dekker, C. Heinzl, and J. Sijbers, "Parametric Reconstruction of Glass Fiber-reinforced Polymer Composites from X-ray Projection Data - A Simulation Study", Journal of Nondestructive Evaluation, vol. 37, issue 62, pp. 1573-4862, Jul, 2018.
Emsell, L., A. Leemans, C. Langan, W. Van Hecke, G. J. Barker, P. McCarthy, B. Jeurissen, J. Sijbers, S. Sunaert, D. M. Cannon, et al., "Limbic and callosal white matter changes in euthymic bipolar I disorder: an advanced diffusion MRI tractography study", Biologicial Psychiatry, vol. 73, issue 2, pp. 194-201, 2013.
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Fatermans, J., K. Müller-Caspary, A J. den Dekker, and S. Van Aert, "Detection of atomic columns from noisy STEM images", Microscopy Conference 2017 (MC 2017), Lausanne, Switzerland, pp. 445-446, 2017.
Fatermans, J., S. Van Aert, and A J. den Dekker, "The maximum a posteriori probability rule for atom column detection from HAADF STEM images", Ultramicroscopy, vol. 201, pp. 81-91, 2019.
Fatermans, J., S. Van Aert, and A J. den Dekker, "Bayesian model-order selection in electron microscopy to detect atomic columns in noisy images", RBSM 2016, Brussels, Belgium, pp. 53, 2016.
Fatermans, J., "Quantitative atom detection from atomic-resolution transmission electron microscopy images", Department of Physics, vol. Doctor of Science/Physics, 2019. PDF icon Download thesis (29.73 MB)
Fatermans, J., A J. den Dekker, and S. Van Aert, "Atom detection from electron microscopy images", RBSM 2019, Louvain-la-Neuve, Belgium, pp. 15, 2019.
Fatermans, J., A J. den Dekker, K. Müller-Caspary, I. Lobato, and S. Van Aert, "The maximum a posteriori probability rule to detect single atoms from low signal-to-noise ratio scanning transmission electron microscopy images", IMC19, Sydney, Australia, 2018.
Fatermans, J., A J. den Dekker, C. M. O'Leary, P. D. Nellist, and S. Van Aert, "Atom column detection from STEM images using the maximum a posteriori probability rule", MC 2019, Berlin, Germany, 2019.
Fatermans, J., A J. den Dekker, K. Müller-Caspary, I. Lobato, and S. Van Aert, "Bayesian analysis of noisy scanning transmission electron microscopy images for single atom detection", SCANDEM 2018, Technical University of Denmark, Kgs. Lyngby, Denmark, pp. 95, 2018.
Fatermans, J., A J. den Dekker, K.. Müller-Caspary, I. Lobato, C.. M. O'Leary, P. D. Nellist, and S. Van Aert, "Single Atom Detection from Low Contrast-to-Noise Ratio Electron Microscopy Images", Phys. Rev. Lett., vol. 121, pp. 056101, Jul, 2018.
Fillard, P., M. Descoteaux, A. Goh, S. Gouttard, B. Jeurissen, J. Malcolm, A. Ramirez-Manzanares, M. Reisert, K. Sakaie, F. Tensaouti, et al., "Quantitative Evaluation of 10 Tractography Algorithms on a Realistic Diffusion MR Phantom", NeuroImage, vol. 56, no. 1, pp. 220-234, May, 2011.
Forde, N. J., L. Ronan, J. Suckling, C. Scanlon, S. Neary, L. Holleran, A. Leemans, R. Tait, C. Rua, P. C. Fletcher, et al., "Structural neuroimaging correlates of allelic variation of the BDNF val66met polymorphism.", NeuroImage, vol. 90, pp. 280-9, 2014 Apr 15.
Forde, N. J., C. Scanlon, L. Emsell, S. O'Donoghue, C. Chaddock, A. Leemans, B. Jeurissen, D. M. Cannon, R. M. Murray, and C. McDonald, "Structural brain network analysis in families multiply affected with bipolar 1 disorder", International Review of Psychosis & Bipolarity, Athens, Greece, 2014.
Forde, N. J., I. Ellison-Wright, P. J. Nathan, R. Zaman, R. Dudas, M. Agius, E. Fernandez-Egea, A. Leemans, B. Jeurissen, C. Scanlon, et al., "White Matter Tract Deficits in Schizophrenia", Neuroscience Ireland Conference, vol. 7, Dublin, Ireland, 2011.
Forde, N. J., S. O'Donoghue, C. Scanlon, L. Emsell, C. Chaddock, A. Leemans, B. Jeurissen, G. J. Barker, D. M. Cannon, R. M. Murray, et al., "Structural brain network analysis in families multiply affected with bipolar I disorder", Psychiatry Research: Neuroimaging, vol. 234, no. 1: Elsevier, pp. 44–51, 2015.
Fortes, W., J. Sijbers, and K. J. Batenburg, "Practical Error Bounds for Binary Tomography", 1st International Conference on Tomography of Materials and Structures, pp. 97-100, 2013. PDF icon Download paper (165.74 KB)
Fransen, E., R. Dhooghe, G. Van Camp, M. Verhoye, J. Sijbers, E. Reyniers, P. Soriano, H. Kamiguchi, R. Willemsen, K. E. Koekoek, et al., "L1 knockout mice show dilated ventricles, vermis hypoplasia and impaired exploration patterns", Human Molecular Genetics, vol. 7, no. 6, pp. 999-1009, 1998. PDF icon Download paper (248.02 KB)
Frenkel, D., J. De Beenhouwer, and J. Sijbers, "An adaptive probability map for the Discrete Algebraic Reconstruction Technique", 10th Conference on Industrial Computed Tomography (ICT 2020), 2020.

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