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Inline edge illumination X-ray phase contrast imaging through mask misalignment

Publication Type:

Journal Article

Authors:

Francken, Nicholas; Jonathan Sanctorum; Joaquim Sanctorum; Pieter-Jan Vanthienen; Jan Sijbers; Jan De Beenhouwer

Source:

Optics Express, Volume 32, Issue 18, p.32048-32061 (2024)

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