Neural network Hilbert transform based filtered backprojection for fast inline X-ray inspection

Publication Type:

Journal Article

Authors:

Eline Janssens; Jan De Beenhouwer; Mattias Van Dael; Thomas De Schryver; Luc Van Hoorebeke; Pieter Verboven; Bart Nicolai; Jan Sijbers

Source:

Measurement Science and Technology, Volume 29, Issue 3 (2018)
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Research area: 
X-ray imaging
Tomography