Publications

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2018
J. Fatermans, den Dekker, A. J., Müller-Caspary, K., Lobato, I., and Van Aert, S., “Bayesian analysis of noisy scanning transmission electron microscopy images for single atom detection”, SCANDEM 2018, Technical University of Denmark, Kgs. Lyngby, Denmark. p. 95, 2018.
S. Van Aert, Fatermans, J., De Backer, A., van den Bos, K. H. W., O'Leary, C. M., Müller-Caspary, K., Jones, L., Lobato, I., Béché, A., den Dekker, A. J., Bals, S., and Nellist, P. D., “Maximising dose efficiency in quantitative STEM to reveal the 3D atomic structure of nanomaterials”, IMC19, Sydney, Australia. 2018.
J. Fatermans, den Dekker, A. J., Müller-Caspary, K., Lobato, I., and Van Aert, S., “The maximum a posteriori probability rule to detect single atoms from low signal-to-noise ratio scanning transmission electron microscopy images”, IMC19, Sydney, Australia. 2018.
2017
J. Fatermans, Müller-Caspary, K., den Dekker, A. J., and Van Aert, S., “Detection of atomic columns from noisy STEM images”, Microscopy Conference 2017 (MC 2017), Lausanne, Switzerland. pp. 445-446, 2017.