Publications

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Author Type [ Year(Desc)]
Filters: Author is Anneke Van Heteren  [Clear All Filters]
2020
M. Nauwynck, Bazrafkan, S., Van Heteren, A., De Beenhouwer, J., and Sijbers, J., “Ring Artifact Reduction in Sinogram Space Using Deep Learning”, in 6th International Conference on Image Formation in X-Ray Computed Tomography, 2020.PDF icon Download paper (2.49 MB)
2023
Z. Liang, Van Heteren, A., Sijbers, J., and De Beenhouwer, J., “Toward denoising of 3D CT scans with few data”, in e-Journal of Nondestructive Testing, 2023, vol. 28, no. 3.PDF icon Download paper (5.93 MB)