Publications

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Author Type [ Year(Desc)]
Filters: Author is E. Bettens  [Clear All Filters]
1996
E. Bettens, Scheunders, P., Sijbers, J., Van Dyck, D., and Moens, L., “Automatic segmentation and modeling of two-dimensional electrophoresis gels”, in Proceedings of IEEE International Conference on Image Processing, Lausanne, Switserland, 1996, vol. 2, pp. 665-668.
1997
E. Bettens, Scheunders, P., Van Dyck, D., Moens, L., and Osta, V. P., “Computer Analysis of Two-Dimensional Electrophoresis Gels : A New Segmentation and Modeling Algorithm”, Electrophoresis, vol. 18, pp. 792-798, 1997.
D. Van Dyck, Bettens, E., Sijbers, J., Op de Beeck, M., den Dekker, A. J., and van den Bos, A., “From High Resolution Image to Atomic Structure: how fare are we?”, Scanning Microscopy, Special Issue on Image Processing, vol. 11, pp. 467-478, 1997.
D. Van Dyck, Bettens, E., Sijbers, J., den Dekker, A. J., van den Bos, A., Op de Beeck, M., Jansen, J., and Zandbergen, H., “Resolving atoms: what do we have? what do we want?”, in Institute of Physics Conference Series, vol. 153, J. M. Rodenburg, Ed. Cambridge, UK: Institute of Physics Ltd, 1997, pp. 95-100.
1998
D. Van Dyck, den Dekker, A. J., Sijbers, J., and Bettens, E., “Dose Limited Resolution”, in Proceedings Microscopy and Microanalysis, Atlanta, Georgia, U.S.A, 1998, vol. 2, pp. 802-803.
E. Bettens, den Dekker, A. J., Sijbers, J., and Van Dyck, D., “Ultimate resolution in the framework of parameter estimation”, in IASTED International Conference - Signal and Image Processing (SIP'98), Las Vegas, Nevada, USA, 1998, pp. 229-233.PDF icon Download paper (113.28 KB)
1999
E. Bettens, Van Dyck, D., den Dekker, A. J., Sijbers, J., and van den Bos, A., “Model-based two-object resolution from observations having counting statistics”, Ultramicroscopy, vol. 77, pp. 37-48, 1999.PDF icon Download full paper (226 KB)
E. Bettens, “Peak Characterization using Parameter Estimation Methods”, University of Antwerp, Antwerp, 1999.
D. Van Dyck, Bettens, E., Sijbers, J., Op de Beeck, M., van den Bos, A., den Dekker, A. J., Jansen, J., and Zandbergen, H., “Towards quantitative structure determination through electron holographic methods”, Materials Characterization, vol. 42, pp. 265-281, 1999.PDF icon Download paper (6.71 MB)