Publications

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Author [ Type(Desc)] Year
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Journal Article
W. Van Aarle, Batenburg, K. J., Van Gompel, G., Van de Casteele, E., and Sijbers, J., “Super-resolution for computed tomography based on discrete tomography”, IEEE Transactions on Image Processing, vol. 23, no. 3, pp. 1181 - 1193, 2014.PDF icon Download paper (2.24 MB)
G. Perfetti, Van de Casteele, E., Rieger, B., Wildeboer, W. J., and Meesters, G. M. H., “X-ray micro tomography and image analysis as complementary methods for morphological characterization and coating thickness measurement of coated particles”, Advanced Powder Technology, vol. 21, no. 6, pp. 663 - 675, 2010.
Thesis
E. Van de Casteele, “Model-based approach for Beam Hardening Correction and Resolution Measurements in Microtomography”, University of Antwerp, Antwerp, 2004.

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