Publications

Export 1146 results:
Author [ Type(Desc)] Year
Book Chapter
F. Danckaers, Huysmans, T., and Sijbers, J., Adaptable digital human models from 3D body scans, in DHM and Posturography, vol. VI, Academic Press, 2019, pp. 459-470.
A. J. den Dekker and Sijbers, J., Advanced Image Processing in Magnetic Resonance Imaging, in Series: Signal Processing and Communications, vol. 27, L. Landini, Ed. Marcel Dekker, 2005, pp. 85-143.
A. De Backer, Fatermans, J., den Dekker, A. J., and Van Aert, S., Chapter Eight - General conclusions and future perspectives, in Advances in Imaging and Electron Physics, vol. 216, Science Direct Elsevier, In Press.
A. De Backer, Fatermans, J., den Dekker, A. J., and Van Aert, S., Chapter Five - Optimal experiment design for nanoparticle atom counting from ADF STEM images, in Advances in Imaging and Electron Physics, vol. 216, Science Direct Elsevier, In Press.
A. De Backer, Fatermans, J., den Dekker, A. J., and Van Aert, S., Chapter Four - Atom counting, in Advances in Imaging and Electron Physics,, vol. 216, Science Direct Elsevier, In Press.
A. De Backer, Fatermans, J., den Dekker, A. J., and Van Aert, S., Chapter One - Introduction, in Advances in Imaging and Electron Physics, vol. 216, Science Direct Elsevier, In Press.
J. Fatermans, De Backer, A., den Dekker, A. J., and Van Aert, S., Chapter Seven - Image-quality evaluation and model selection with maximum a posteriori probability, in Advances in Imaging and Electron Physics, vol. 216, Science Direct Elsevier, In Press.
J. Fatermans, De Backer, A., den Dekker, A. J., and Van Aert, S., Chapter Six - Atom column detection, in Advances in Imaging and Electron Physics, vol. 216, Science Direct Elsevier, In Press.
A. De Backer, Fatermans, J., den Dekker, A. J., and Van Aert, S., Chapter Three - Efficient fitting algorithm, in Advances in Imaging and Electron Physics, vol. 216, Science Direct Elsevier, In Press.
A. De Backer, Fatermans, J., den Dekker, A. J., and Van Aert, S., Chapter Two - Statistical parameter estimation theory: principles and simulation studies, in Advances in Imaging and Electron Physics, vol. 216, Science Direct Elsevier, In Press.
J. Juntu, Schepper, A. D. M., Van Dyck, P., Van Dyck, D., Gielen, J. L., Parizel, P. M., and Sijbers, J., Classification of Soft Tissue Tumors by Machine Learning Algorithms, in Soft Tissue Tumors, InTech, 2011.PDF icon Book.Chapter-Copy.Sent_.to_.InTech-(21.07.2011).pdf (732.07 KB)
R. Pinho, Tournoy, K. G., and Sijbers, J., Computer-Aided Assessment and Stenting of Tracheal Stenosis, in Computer Aided Diagnosis of Lung Imaging, A. El-Baz, Ed. 2010.PDF icon Download chapter (4.67 MB)
P. Scheunders, Tuia, D., and Moser, G., Contributions of Machine Learning to Remote Sensing Data Analysis, in Comprehensive Remote Sensing, vol. 2, 2018, pp. 199-243.
S. Scataglini, Danckaers, F., Huysmans, T., Sijbers, J., and Andreoni, G., Design smart clothing using digital human models, in DHM and Posturography, Academic Press, 2019, pp. 683-698.
J. Veraart and Sijbers, J., Diffusion Kurtosis Imaging, in Diffusion Tensor Imaging: a practical handbook, New York: Springer-Verlag, 2016, pp. 407-418.
G. Van Eyndhoven and Sijbers, J., Iterative reconstruction methods in X-ray CT, in Handbook of X-ray Imaging: Physics and Technology, CRC Press, 2018, pp. 693-712.
J. Sijbers and Van Der Linden, A., Magnetic Resonance Imaging, In: Encyclopedia of Optical Engineering, Marcel Dekker, 2003, pp. 1237-1258.
D. Van Dyck, Bettens, E., Sijbers, J., den Dekker, A. J., van den Bos, A., Op de Beeck, M., Jansen, J., and Zandbergen, H., Resolving atoms: what do we have? what do we want?, in Institute of Physics Conference Series, vol. 153, J. M. Rodenburg, Ed. Cambridge, UK: Institute of Physics Ltd, 1997, pp. 95-100.
P. Scheunders, A wavelet representation of multispectral images; in: Frontiers of Remote Sensing Information Processing, C. H. Chen, Ed. World Scientific, 2003, pp. 197-224.
P. Scheunders, Duijster, A., and Zhang, Y., Wavelet-based Multi/Hyperspectral Image Restoration and Fusion, in Signal and Image Processing for Remote Sensing, C. H. Chen, Ed. Taylor and Francis, 2012, pp. 505-523.

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