Jan Sijbers

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2015
Q. Collier, Veraart, J., Jeurissen, B., den Dekker, A. J., and Sijbers, J., “Iterative Reweighted Linear Least Squares for Accurate, Fast, and Robust Estimation of Diffusion Magnetic Resonance Parameters”, Magnetic Resonance in Medicine, vol. 73, no. 6, pp. 2174–2184, 2015.
B. Goris, De Beenhouwer, J., De Backer, A., Zanaga, D., Batenburg, K. J., Sánchez-Iglesias, A., Liz-Marzán, L. M., Van Aert, S., Bals, S., Sijbers, J., and Van Tendeloo, G., “Measuring Lattice Strain in Three Dimensions through Electron Microscopy”, Nano Letters, vol. 15, no. 10, pp. 6996–7001, 2015.
G. Van Eyndhoven, “Model-based iterative reconstruction algorithms for computed tomography”, 2015.PDF icon Download thesis (4.93 MB)
J. Cant, Palenstijn, W. J., Behiels, G., and Sijbers, J., “Modeling blurring effects due to continuous gantry rotation: application to region of interest tomography”, Medical Physics, vol. 42, no. 5, pp. 2709-2717, 2015.
S. Cools, Ghysels, P., Van Aarle, W., Sijbers, J., and Vanroose, W., “A multi-level preconditioned Krylov method for the efficient solution of algebraic tomographic reconstruction problems”, Journal of Computational and Applied Mathematics, vol. 238, no. 1, pp. 1-16, 2015.
E. Janssens, De Beenhouwer, J., Van Dael, M., Verboven, P., Nicolai, B., and Sijbers, J., “Neural Network Based X-Ray Tomography for Fast Inspection of Apples on a Conveyor Belt”, in IEEE International Conference on Image Processing, 2015, pp. 917-921.
M. Van Dael, Rogge, S., Verboven, P., Saeys, W., Sijbers, J., and Nicolai, B., “Online Tomato Inspection Using X-Ray Radiographies and 3- Dimensional Shape Models”, Chemical Engineering Transactions, vol. 44, pp. 37-42, 2015.
S. Van der Jeught, “Optical techniques for real-time morphology measurement of the tympanic membrane”, 2015.
G. Ramos-Llordén, Segers, H., Palenstijn, W. J., den Dekker, A. J., and Sijbers, J., “Partial discreteness: a new type of prior knowledge for MRI reconstruction”, 23rd Annual meeting of the ISMRM, Toronto, Canada., vol. 23. p. 3417, 2015.PDF icon Download abstract (1.14 MB)
G. Ramos-Llordén, Segers, H., Palenstijn, W. J., den Dekker, A. J., and Sijbers, J., “Partially discrete magnetic resonance tomography”, in 2015 IEEE International Conference on Image Processing (ICIP), 2015, pp. 1653-1657.
G. Van Eyndhoven, Kurttepeli, M., Van Oers, C. J., Cool, P., Bals, S., Batenburg, K. J., and Sijbers, J., “Pore REconstruction and Segmentation (PORES) method for improved porosity quantification of nanoporous materials”, Ultramicroscopy, vol. 148, pp. 10-19, 2015.
D. Zanaga, Bleichrodt, F., Altantzis, T., Winckelmans, N., Palenstijn, W. J., Sijbers, J., van Nijs, B., van Huis, M. A., van Blaaderen, A., Sánchez-Iglesias, A., Liz-Marzán, L. M., Batenburg, K. J., Bals, S., and Van Tendeloo, G., “Quantitative 3D analysis of huge nanoparticle assemblies”, Nanoscale, vol. 8, no. 1, pp. 292-299, 2015.
G. Van Eyndhoven, Batenburg, K. J., and Sijbers, J., “Region based 4D tomographic image reconstruction: application to cardiac X-ray CT”, in IEEE International Conference on Image Processing, 2015, pp. 113 - 117.PDF icon Download paper (708.79 KB)
G. Ramos-Llordén, den Dekker, A. J., Van Steenkiste, G., Van Audekerke, J., Verhoye, M., and Sijbers, J., “Simultaneous group-wise rigid registration and T1 ML estimation for T1 mapping”, 7th meeting of the ISMRM Benelux Chapter, Gent, Belgium, January. 2015.
G. Ramos-Llordén, den Dekker, A. J., Van Steenkiste, G., Van Audekerke, J., Verhoye, M., and Sijbers, J., “Simultaneous group-wise rigid registration and T1 ML estimation for T1 mapping”, 23rd Annual meeting of the ISMRM, Toronto, Canada., vol. 23. p. 447, 2015.PDF icon Download abstract (910.6 KB)
G. Ramos-Llordén, den Dekker, A. J., Van Steenkiste, G., Van Audekerke, J., Verhoye, M., and Sijbers, J., “Simultaneous motion correction and T1 estimation in quantitative T1 mapping: An ML restoration approach”, in 2015 IEEE International Conference on Image Processing (ICIP), 2015, pp. 3160-3164.
J. Soons, Danckaers, F., Huysmans, T., Sijbers, J., Casselamn, J. W., and Dirckx, J. J. J., “Statistical shape modeling of the incudomalleolar complex using micro-CT and clinical cone-beam CT”, MEMRO: 7th International Symposium on Middle Ear Mechanics in Research and Otology. Aalborg, Denmark, 2015.
L. Serbruyns, Leunissen, I., Huysmans, T., Cuypers, K., Meesen, R. L., van Ruitenbeek, P., Sijbers, J., and Swinnen, S. P., “Subcortical volumetric changes across the adult lifespan: subregional thalamic atrophy accounts for age-related sensorimotor performance declines”, Cortex, vol. 65, pp. 128-138, 2015.PDF icon paper (1.35 MB)
G. Van Steenkiste, Hamaide, J., Jeurissen, B., Poot, D. H. J., Van Audekerke, J., Sijbers, J., and Verhoye, M., “Super-resolution structural connectivity and anatomy of the zebra finch brain ”, ISMRM Benelux. 2015.
G. Van Steenkiste, Poot, D. H. J., Jeurissen, B., den Dekker, A. J., and Sijbers, J., “Super-resolution T1 mapping: a simulation study”, ISMRM 23th Annual Meeting, Toronto, Ontario, Canada, vol. 23. p. 1679, 2015.PDF icon Download abstract (1.22 MB)
Q. Collier, Veraart, J., Jeurissen, B., den Dekker, A. J., and Sijbers, J., “Theoretical study of the free water elimination model”, 7th Annual Meeting of the Benelux ISMRM Chapter, Ghent, Belgium. p. 78, 2015.
Q. Collier, Veraart, J., Jeurissen, B., den Dekker, A. J., and Sijbers, J., “Theoretical study of the free water elimination model”, ISMRM 23th Annual Meeting, Toronto, Ontario, Canada, vol. 23. p. 2757, 2015.PDF icon Download abstract (594.47 KB)
Q. Collier, Veraart, J., Jeurissen, B., den Dekker, A. J., and Sijbers, J., “Theoretical study of the free water elimination model”, Proc. Intl. Soc. Mag. Reson. Med. 23, vol. 15. p. 2757, 2015.
B. Jeurissen, Tournier, J. - D., and Sijbers, J., “Tissue-type segmentation using non-negative matrix factorization of multi-shell diffusion-weighted MRI images”, ISMRM 23th Annual Meeting, Toronto, Ontario, Canada, vol. 23. p. 349, 2015.PDF icon Download abstract (1.11 MB)
T. De Schryver, Dierick, M., Van Hoorebeke, L., Verboven, P., Van Dael, M., and Sijbers, J., “Tomography for in-line product inspection”, U.S. Patent EP3106863A12015.

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