Arjan den Dekker

Arjan den Dekker's picture


Dr. Ir.
den Dekker

imec - Vision Lab,
Department of Physics
University of Antwerp (CDE)
Universiteitsplein 1 (N.1.10)
B-2610 Antwerpen, Belgium

+32 (0) 3 265 28 69
+32 (0) 3 265 22 45



Arnold J. (Arjan) den Dekker received the M.Sc. degree (cum laude) in applied physics in 1992 and the Ph.D. degree (cum laude) in 1997, both from Delft University of Technology (DUT), The Netherlands. His Ph.D. thesis entitled Model-based resolution reviews past and present approaches to resolution and presents an alternative model-based resolution criterion.

From April 1997 to August 1998 he held a short term visiting position at the Vision Lab, University of Antwerp, Belgium. From September 1998 to June 1999 he worked as a research fellow at the Centre for Electron Microscopy and Materials Science (EMAT), University of Antwerp, Belgium.

In July 1999 he was awarded a prestigious talent research fellowship of the Royal Netherlands Academy of Arts and Sciences (KNAW), which funded his position as a KNAW research fellow at DUT from 1999 to 2004. His KNAW research project was entitled "Towards quantitative structure determination through electron microscopy".

From 2004 to 2018, Arjan held a position as Assistant Professor at the Delft Center for Systems and Control of Delft University of Technology.

Since 2013, he has been working at the Vision Lab of the University of Antwerp as a postdoc/visiting professor and senior researcher successively.

His research interests include statistical signal processing and inverse problems. His research is embedded in the application domain of physical imaging systems, with special reference to magnetic resonance imaging and electron microscopy.


Key publications: 
J. Sijbers, den Dekker, A. J., Raman, E., and Van Dyck, D., Parameter estimation from magnitude MR images, International Journal of Imaging Systems and Technology, vol. 10, pp. 109-114, 1999.PDF icon Download paper (350.44 KB)