Novel grating designs for cone-beam edge illumination X-ray phase contrast imaging

Publication Type:

Conference Paper

Authors:

Pieter-Jan Vanthienen; Jonathan Sanctorum; Ben Huyge; Nathanaël Six; Jan Sijbers; Jan De Beenhouwer

Source:

SPIE Optical Engineering: Developments in X-Ray Tomography XIV (In Press)
Research area: 
X-ray imaging