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Novel grating designs for cone-beam edge illumination X-ray phase contrast imaging
Publication Type:
Conference Paper
Authors:
Pieter-Jan Vanthienen
;
Jonathan Sanctorum
;
Ben Huyge
;
Nathanaël Six
;
Jan Sijbers
;
Jan De Beenhouwer
Source:
SPIE Optical Engineering: Developments in X-Ray Tomography XIV (In Press)
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BibTeX
Research area:
X-ray imaging