Publications

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Author Type [ Year(Desc)]
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2015
W. Van Aarle, Palenstijn, W. J., De Beenhouwer, J., Altantzis, T., Bals, S., Batenburg, K. J., and Sijbers, J., “The ASTRA Toolbox: a platform for advanced algorithm development in electron tomography”, Ultramicroscopy, vol. 157, pp. 35–47, 2015.PDF icon Download paper (3.47 MB)
D. Zanaga, Bleichrodt, F., Altantzis, T., Winckelmans, N., Palenstijn, W. J., Sijbers, J., van Nijs, B., van Huis, M. A., van Blaaderen, A., Sánchez-Iglesias, A., Liz-Marzán, L. M., Batenburg, K. J., Bals, S., and Van Tendeloo, G., “Quantitative 3D analysis of huge nanoparticle assemblies”, Nanoscale, vol. 8, no. 1, pp. 292-299, 2015.
2016
D. Zanaga, Altantzis, T., Sanctorum, J., Freitag, B., and Bals, S., “An alternative approach for ζ-factor measurement using pure element nanoparticles”, Ultramicroscopy, vol. 164, pp. 11–16, 2016.
D. Zanaga, Bleichrodt, F., Altantzis, T., Winckelmans, N., Palenstijn, W. J., Sijbers, J., de Nijs, B., van Huis, M. A., Sánchez-Iglesias, A., Liz-Marzán, L. M., van Blaaderen, A., Batenburg, K. J., Bals, S., and Van Tendeloo, G., “Quantitative 3D analysis of huge nanoparticle assemblies.”, Nanoscale, vol. 8, no. 1, pp. 292-9, 2016.
2020
S. Van Aert, De Backer, A., De wael, A., Fatermans, J., Friedrich, T., Lobato, I., O'Leary, C. M., Varambhia, A., Altantzis, T., Jones, L., den Dekker, A. J., Nellist, P. D., and Bals, S., “3D Atomic Scale Quantification of Nanostructures and their Dynamics Using Model-based STEM”, Microscopy & Microanalysis 2020 (online), Milwaukee, United States. 2020.