Publications

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2018
E. Janssens, De Beenhouwer, J., Van Dael, M., De Schryver, T., Van Hoorebeke, L., Verboven, P., Nicolai, B., and Sijbers, J., “Neural network Hilbert transform based filtered backprojection for fast inline X-ray inspection”, Measurement Science and Technology, vol. 29, no. 3, 2018.PDF icon Download paper (3.4 MB)
2017
V. Van Nieuwenhove, De Beenhouwer, J., De Schryver, T., Van Hoorebeke, L., and Sijbers, J., “Data-Driven Affine Deformation Estimation and Correction in Cone Beam Computed Tomography”, IEEE Transactions on Image Processing, vol. 26, no. 3, pp. 1441-1451, 2017.
2016
M. Van Dael, Danckaers, F., De Schryver, T., Huysmans, T., Verboven, P., Van Hoorebeke, L., Sijbers, J., and Nicolai, B., “Combining 3D vision and X-ray radiography for internal quality inspection of foods”, 30th Targeted Technologies for Sustainable Food Systems (EFFoST) International Conference. Austrian Economic Chamber, Vienna, Austria, 2016.
T. De Schryver, Dhaene, J., Dierick, M., Boone, M. N., Janssens, E., Sijbers, J., Van Dael, M., Verboven, P., Nicolai, B., and Van Hoorebeke, L., “In-line NDT with X-Ray CT combining sample rotation and translation”, NDT & E International, vol. 89, pp. 89–98, 2016.
2015
V. Van Nieuwenhove, De Beenhouwer, J., De Schryver, T., Van Hoorebeke, L., and Sijbers, J., “Affine deformation correction in cone beam Computed Tomography”, in Fully Three-Dimensional Image Reconstruction in Radiology and Nuclear Medicine, Newport, Rhode Island, USA, 2015, pp. 182-185.
T. De Schryver, Dierick, M., Van Hoorebeke, L., Verboven, P., Van Dael, M., and Sijbers, J., “Tomography for in-line product inspection”, U.S. Patent EP3106863A12015.