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Conference Paper
A. Presenti, Sijbers, J., Dekker, A. J. den, and De Beenhouwer, J., “CAD-based defect inspection with optimal view angle selection based on polychromatic X-ray projection images”, in 9th Conference on Industrial Computed Tomography, Padova, Italy, 2019, pp. 1-5.PDF icon ict2019_full_paper_55.pdf (216.2 KB)