Publications

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Conference Abstract
J. Fatermans, Van Aert, S., and den Dekker, A. J., “Bayesian model-order selection in electron microscopy to detect atomic columns in noisy images”, RBSM 2016, Brussels, Belgium. p. 53, 2016.
J. Fatermans, den Dekker, A. J., Gauquelin, N., Verbeeck, J., and Van Aert, S., “Bayesian model selection for atom column detection from ABF-ADF STEM images”, Virtual Early Career EMC 2020 (online), Copenhagen, Denmark. 2020.
J. Fatermans, den Dekker, A. J., Müller-Caspary, K., Lobato, I., and Van Aert, S., “Bayesian analysis of noisy scanning transmission electron microscopy images for single atom detection”, SCANDEM 2018, Technical University of Denmark, Kgs. Lyngby, Denmark. p. 95, 2018.
J. Fatermans, den Dekker, A. J., and Van Aert, S., “Atom detection from electron microscopy images”, RBSM 2019, Louvain-la-Neuve, Belgium. p. 15, 2019.
J. Fatermans, den Dekker, A. J., O'Leary, C. M., Nellist, P. D., and Van Aert, S., “Atom column detection from STEM images using the maximum a posteriori probability rule”, MC 2019, Berlin, Germany. 2019.
G. Ramos-Llordén, Beirinckx, Q., den Dekker, A. J., and Sijbers, J., “Accurate and precise MRI relaxometry: the often disregarded but critical role of statistical parameter estimation”, Proceedings of the International Society for Magnetic Resonance in Medicine (ISMRM), 26th Annual Meeting. Paris, France, p. 5664, 2018.
B. Shafieizargar, Jeurissen, B., Poot, D. H. J., Van Audekerke, J., Verhoye, M., den Dekker, A. J., and Sijbers, J., “Accelerated multi-shot diffusion weighted imaging with joint estimation of diffusion and phase parameters”, Magn Reson Mater Phy, vol. 34. pp. S57-S58, 2021.
P. Bladt, den Dekker, A. J., Clement, P., Achten, E., and Sijbers, J., “Absolute CBF quantification in multi-time point ASL: the T1 issue”, 10th Annual Meeting of ISMRM Benelux, January 26th 2018, Antwerp, Belgium. 2018.
S. Van Aert, De Backer, A., De wael, A., Fatermans, J., Friedrich, T., Lobato, I., O'Leary, C. M., Varambhia, A., Altantzis, T., Jones, L., den Dekker, A. J., Nellist, P. D., and Bals, S., “3D Atomic Scale Quantification of Nanostructures and their Dynamics Using Model-based STEM”, Microscopy & Microanalysis 2020 (online), Milwaukee, United States. 2020.
Book Chapter
D. Van Dyck, Bettens, E., Sijbers, J., den Dekker, A. J., van den Bos, A., Op de Beeck, M., Jansen, J., and Zandbergen, H., “Resolving atoms: what do we have? what do we want?”, in Institute of Physics Conference Series, vol. 153, J. M. Rodenburg, Ed. Cambridge, UK: Institute of Physics Ltd, 1997, pp. 95-100.
A. De Backer, Fatermans, J., den Dekker, A. J., and Van Aert, S., “Chapter Two - Statistical parameter estimation theory: principles and simulation studies”, in Advances in Imaging and Electron Physics, vol. 217, Science Direct Elsevier, 2021.
A. De Backer, Fatermans, J., den Dekker, A. J., and Van Aert, S., “Chapter Three - Efficient fitting algorithm”, in Advances in Imaging and Electron Physics, vol. 217, Science Direct Elsevier, 2021.
J. Fatermans, De Backer, A., den Dekker, A. J., and Van Aert, S., “Chapter Six - Atom column detection”, in Advances in Imaging and Electron Physics, vol. 217, Science Direct Elsevier, 2021.
J. Fatermans, De Backer, A., den Dekker, A. J., and Van Aert, S., “Chapter Seven - Image-quality evaluation and model selection with maximum a posteriori probability”, in Advances in Imaging and Electron Physics, vol. 217, Science Direct Elsevier, 2021.
A. De Backer, Fatermans, J., den Dekker, A. J., and Van Aert, S., “Chapter One - Introduction”, in Advances in Imaging and Electron Physics, vol. 217, Science Direct Elsevier, 2021.
A. De Backer, Fatermans, J., den Dekker, A. J., and Van Aert, S., “Chapter Four - Atom counting”, in Advances in Imaging and Electron Physics,, vol. 217, Science Direct Elsevier, 2021.
A. De Backer, Fatermans, J., den Dekker, A. J., and Van Aert, S., “Chapter Five - Optimal experiment design for nanoparticle atom counting from ADF STEM images”, in Advances in Imaging and Electron Physics, vol. 217, Science Direct Elsevier, 2021.
A. De Backer, Fatermans, J., den Dekker, A. J., and Van Aert, S., “Chapter Eight - General conclusions and future perspectives”, in Advances in Imaging and Electron Physics, vol. 217, Science Direct Elsevier, 2021.
A. J. den Dekker and Sijbers, J., “Advanced Image Processing in Magnetic Resonance Imaging”, in Series: Signal Processing and Communications, vol. 27, L. Landini, Ed. Marcel Dekker, 2005, pp. 85-143.

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