Publications

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Conference Paper
J. Deng, Meenaketan, B. Linkoon P., Takalloo, S. Ebrahimi, Chai, Y. Chin, Torfs, T., Braeken, D., De Beenhouwer, J., and Sijbers, J., “In-depth imaging of in-vitro tissue models using electrical impedance tomography”, in iCT 2025 - 14th Conference on Industrial Computed Tomography, 2025, vol. 4 - 7 February.
C. Van Dijck, Wirix-Speetjens, R., Huysmans, T., Danckaers, F., Sijbers, J., and Vander Sloten, J., “Influence of Correspondence Method on Statistical Model Based Shape Prediction”, in IEEE International Symposium on Biomedical Imaging (ISBI), 2014.PDF icon isbi2014_abstract.pdf (250.1 KB)PDF icon isbi2014_poster.pdf (1.8 MB)
L. F. Alves Pereira, Roelandts, T., and Sijbers, J., “Inline 3D X-ray Inspection of Food using Discrete Tomography”, in InsideFood Symposium, Leuven, Belgium, 2013.PDF icon Download paper (292.06 KB)
J. Verstraete, Francken, N., Sijbers, J., and De Beenhouwer, J., “Inline Edge Illumination Computed Tomography: A Simulation Study”, in 2026 IEEE 23rd Mediterranean Electrotechnical Conference (MELECON), Cairo, Egypt, 2026.PDF icon Download paper (8.68 MB)
N. Francken, De Beenhouwer, J., and Sijbers, J., “Inline edge illumination through sample mask misalignment: a proof of concept”, in Proceedings of the 6th International Conference on X-ray and Neutron Phase Imaging with Gratings, Shenzhen, China, 2024.PDF icon inline_edge_misalign_xnpig.pdf (209.25 KB)
A. Leemans, Sijbers, J., Van den Broek, W., and Yang, Z., “An Interactive Curvature Based Rigid-body Image Registration Technique: an Application to EFTEM”, in 13th European Microscopy Congress, Antwerp, Belgium, 2004.
J. Weissenböck, Fröhler, B., Gröller, E., Sanctorum, J., De Beenhouwer, J., Sijbers, J., Karunakaran, S. Ayalur, Hoeller, H., Kastner, J., and Heinzl, C., “An Interactive Visual Comparison Tool for 3D Volume Datasets represented by Nonlinearly Scaled 1D Line Plots through Space-filling Curves”, in 9th Conference on Industrial Computed Tomography, Padova, Italy, 2019.PDF icon Download paper (1.22 MB)
K. Zarei Zefreh, De Beenhouwer, J., Welford, F. M., and Sijbers, J., “Investigation on Effect of scintillator thickness on Afterglow in Indirect X-ray Detectors”, in 6th Conference on Industrial Computed Tomography, Wels, Austria (iCT 2016), 2016.
K. Zarei Zefreh, Welford, F. M., and Sijbers, J., “Investigation on the effect of exposure time on scintillator afterglow for ultra-fast tomography acquisition”, in 18th International Workshop on Radiation Imaging Detectors, Barcelona, Spain, 2016, vol. 11, p. C12014.PDF icon Download paper (482.36 KB)
K. Van Slambrouck, Van Gompel, G., Defrise, M., Batenburg, K. J., Sijbers, J., and Nuyts, J., “Iterative correction of beam hardening artifacts in CT”, in The First International Conference on Image Formation in X-Ray Computed Tomography, 2010.
N. Six, De Beenhouwer, J., Van Nieuwenhove, V., Vanroose, W., and Sijbers, J., “Joint reconstruction and flat-field estimation using support estimation”, in IEEE Nuclear Science Symposium and Medical Imaging Conference, Sydney, Australia, 2018.PDF icon Download paper (1.53 MB)
N. Six, Renders, J., De Beenhouwer, J., and Sijbers, J., “Joint reconstruction of attenuation, refraction and dark field X-ray phase contrasts using split Barzilai-Borwein steps”, in SPIE Optical Engineering: Developments in X-Ray Tomography XIV , 2022, vol. 12242, p. 122420O.
A. Leemans, Sijbers, J., Verhoye, M., and Van Der Linden, A., “A Library of 3D synthetic DT-MRI models for testing White Matter fiber Tractography Algorithms”, in 21th Annual Scientific Meeting - European Society for Magnetic Resonance in Medicine and Biology, Copenhagen, Denmark, 2004, p. 42.
T. Roelandts, Batenburg, K. J., and Sijbers, J., “Localizing DART using the Reconstructed Residual Error”, in 1st International Conference on Tomography of Materials and Structures (ICTMS), Ghent, Belgium, 2013, vol. Book of Abstracts: Talks, pp. 113-116.PDF icon Download full paper (491.53 KB)
V. Nguyen, De Beenhouwer, J., Sanctorum, J., Van Wassenbergh, S., Aerts, P., Dirckx, J. J. J., and Sijbers, J., “A low-cost and easy-to-use phantom for cone-beam geometry calibration of a tomographic X-ray system”, in 9th Conference on Industrial Computed Tomography, Padova, Italy, 2019.PDF icon Download paper (1.93 MB)
J. Sijbers and den Dekker, A. J., “Mapping a polyhedron onto a sphere: application to Fourier descriptors”, in 22nd Benelux Meeting on Systems and Control, Lommel, Belgium, 2003.
J. Rajan, Verhoye, M., and Sijbers, J., “A maximum likelihood estimation method for denoising magnitude MRI using restricted local neighborhood”, in SPIE Medical Imaging, 2011, vol. 7962.
A. J. den Dekker and Sijbers, J., “Maximum Likelihood estimation of signal amplitude and noise variance”, in 13th IFAC Symposium on System Identification (SYSID-2003), Rotterdam, The Netherlands, 2003, pp. 126-131.
A. J. den Dekker, Sijbers, J., Verhoye, M., and Van Dyck, D., “Maximum Likelihood estimation of the signal component magnitude in phase contrast MR images”, in Proceedings of SPIE Medical Imaging, San Diego, California, USA, 1998, vol. 3338, pp. 408-415.
W. Van Aarle, Ghysels, P., Sijbers, J., and Vanroose, W., “Memory access optimization for iterative tomography on many-core architectures”, in The 12th International Meeting on Fully Three-Dimensional Image Reconstruction in Radiology and Nuclear Medicine, 2013, pp. 364-367.PDF icon fully3d_wvaarle.pdf (2.8 MB)
T. Huysmans and Sijbers, J., “Mesh smoothing through multiscale anisotropic diffusion of geometry images”, in 13th European Microscopy Congress (EMC), Antwerp, Belgium, 2004.PDF icon Full text (414.55 KB)
J. Renders, De Beenhouwer, J., and Sijbers, J., “Mesh-based reconstruction of dynamic foam images using X-ray CT”, in International Conference on 3D Vision (3DV2021), 2021, pp. 1312-1320.
A. Leemans, Van Hecke, W., Lebel, C., Walker, L., Sijbers, J., and Beaulieu, C., “A model based approach for voxelwise analysis of multi-subject diffusion tensor data”, in Joint Annual Meeting ISMRM-ESMRMB, Berlin, 2007.
E. Van de Casteele, Van Dyck, D., Sijbers, J., and Raman, E., “A model-based correction method for beam-hardening artifacts in X-ray tomography”, in 22nd Benelux Meeting on Systems and Control, Lommel, Belgium, 2003.
E. Van de Casteele, Van Dyck, D., Sijbers, J., and Raman, E., “Modelling of Beam hardening in micro CT”, in IEEE International Symposium on Biomedical Imaging, Washington DC, USA, 2003, pp. 57-58.PDF icon Download full paper (163.52 KB)

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