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V. Nguyen, De Beenhouwer, J., Sanctorum, J., Van Wassenbergh, S., Aerts, P., Dirckx, J. J. J., and Sijbers, J., “A low-cost and easy-to-use phantom for cone-beam geometry calibration of a tomographic X-ray system”, in 9th Conference on Industrial Computed Tomography, Padova, Italy, 2019.PDF icon Download paper (1.93 MB)
V. Nguyen, De Beenhouwer, J., Bazrafkan, S., Hoang, A. - T., Van Wassenbergh, S., and Sijbers, J., “BeadNet: a network for automated spherical marker detection in radiographs for geometry calibration”, in 6th International Conference on Image Formation in X-Ray Computed Tomography, 2020, pp. 518-521.PDF icon Download paper (2.16 MB)
V. Nguyen, De Beenhouwer, J., Sanctorum, J., Van Wassenbergh, S., Bazrafkan, S., Dirckx, J. J. J., and Sijbers, J., “A low-cost geometry calibration procedure for a modular cone-beam X-ray CT system”, Nondestructive Testing and Evaluation , vol. 35, no. 3, pp. 252-265, 2020.