Jan Sijbers

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Conference Paper
M. Van Dael, Verboven, P., Van Hoorebeke, L., Sijbers, J., and Nicolai, B., Comparison of methods for online inspection of apple internal quality, in 7th Conference on Industrial Computed Tomography, Leuven, Belgium, 2017.PDF icon Download paper (815.39 KB)
Conference Abstract
P. Bladt, den Dekker, A. J., Clement, P., Achten, E., and Sijbers, J., Maximizing precision in PCASL MRI using an optimized sampling strategy, 34th Annual Scientific Meeting of the European Society for Magnetic Resonance in Medicine & Biology, Barcelona, Spain. 2017.

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