Publications

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2020
S. Van Aert, De Backer, A., De wael, A., Fatermans, J., Friedrich, T., Lobato, I., O'Leary, C. M., Varambhia, A., Altantzis, T., Jones, L., den Dekker, A. J., Nellist, P. D., and Bals, S., 3D Atomic Scale Quantification of Nanostructures and their Dynamics Using Model-based STEM, Microscopy & Microanalysis 2020 (online), Milwaukee, United States. 2020.
S. Van Aert, De Backer, A., De wael, A., Fatermans, J., Friedrich, T., Lobato, I., O'Leary, C. M., Varambhia, A., Altantzis, T., Jones, L., den Dekker, A. J., Nellist, P. D., and Bals, S., 3D Atomic Scale Quantification of Nanostructures and their Dynamics Using Model-based STEM, Microscopy & Microanalysis 2020 (online), Milwaukee, United States. 2020.
J. Fatermans, den Dekker, A. J., Gauquelin, N., Verbeeck, J., and Van Aert, S., Bayesian model selection for atom column detection from ABF-ADF STEM images, Virtual Early Career EMC 2020 (online), Copenhagen, Denmark. 2020.
S. Van Aert, De Backer, A., De wael, A., Fatermans, J., E Irmak, A., Friedrich, T., Lobato, I., Jones, L., den Dekker, A. J., Nellist, P. D., and Bals, S., Strategies for quantifying the 3D atomic structure and the dynamics of nanomaterials using model-based STEM, Virtual MRS Spring/ Fall Meeting, Boston, United States (online). 2020.
S. Van Aert, De Backer, A., De wael, A., Fatermans, J., E Irmak, A., Friedrich, T., Lobato, I., Jones, L., den Dekker, A. J., Nellist, P. D., and Bals, S., Strategies for quantifying the 3D atomic structure and the dynamics of nanomaterials using model-based STEM, Virtual MRS Spring/ Fall Meeting, Boston, United States (online). 2020.