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Filters: Author is Pieter-Jan Vanthienen  [Clear All Filters]
2025
P. - J. Vanthienen, Francken, N., Sanctorum, J., Sijbers, J., and De Beenhouwer, J., “Gratings for multiresolution edge illumination X-ray phase contrast imaging: concept and simulation”, Optics Express, vol. 33, no. 8, pp. 17886-17902, 2025.
P. - J. Vanthienen, “Towards adaptive multi-resolution edge illumination X-ray phase contrast imaging”, 2025.
2024
N. Francken, Sanctorum, J., Sanctorum, J., Vanthienen, P. - J., Sijbers, J., and De Beenhouwer, J., “Inline edge illumination X-ray phase contrast imaging through mask misalignment”, Optics Express, vol. 32, no. 18, pp. 32048-32061, 2024.PDF icon Download paper (1.69 MB)
J. De Beenhouwer, Sijbers, J., and Vanthienen, P. - J., “Mask assembly for edge illumination phase contrast radiation imaging”, U.S. Patent EP2025062978W2024.
P. - J. Vanthienen, Francken, N., Sijbers, J., and De Beenhouwer, J., “Multi-resolution gratings for edge illumination x-ray phase contrast imaging: a simulation study”, in Developments in X-Ray Tomography XV, 2024, vol. 13152, p. 1315208.
P. - J. Vanthienen, Sijbers, J., and De Beenhouwer, J., “A simulation study of optimized-aperture gratings for edge illumination cone-beam phase contrast x-ray imaging”, Proceedings of the 6th International Conference on X-ray and Neutron Phase Imaging with Gratings. Shenzhen, China, 2024.Microsoft Office document icon proceeding_xnpig_pjvanthienen (165.5 KB)
2023
B. Huyge, Vanthienen, P. - J., Six, N., Sijbers, J., and De Beenhouwer, J., “Adapting an XCT-scanner to enable edge illumination X-ray phase contrast imaging”, in e-Journal of Nondestructive Testing, 2023, vol. 28, no. 3.
P. - J. Vanthienen, Sanctorum, J., Huyge, B., Six, N., Sijbers, J., and De Beenhouwer, J., “Grating designs for cone beam edge illumination X-ray phase contrast imaging: a simulation study”, Optics Express, vol. 31, no. 17, pp. 28051-28064, 2023.
2022
P. - J. Vanthienen, Sanctorum, J., Huyge, B., Six, N., Sijbers, J., and De Beenhouwer, J., “Alternative grating designs for cone-beam edge illumination X-ray phase contrast imaging”, in Proc. SPIE 12242, Developments in X-Ray Tomography XIV, San Diego, USA, 2022, vol. 12242, p. 122420Z.