Publications

Export 18 results:
Author Type [ Year(Asc)]
Filters: Author is Sara Bals  [Clear All Filters]
2020
S. Van Aert, De Backer, A., De wael, A., Fatermans, J., Friedrich, T., Lobato, I., O'Leary, C. M., Varambhia, A., Altantzis, T., Jones, L., den Dekker, A. J., Nellist, P. D., and Bals, S., “3D Atomic Scale Quantification of Nanostructures and their Dynamics Using Model-based STEM”, Microscopy & Microanalysis 2020 (online), Milwaukee, United States. 2020.
S. Van Aert, De Backer, A., De wael, A., Fatermans, J., E Irmak, A., Friedrich, T., Lobato, I., Jones, L., den Dekker, A. J., Nellist, P. D., and Bals, S., “Strategies for quantifying the 3D atomic structure and the dynamics of nanomaterials using model-based STEM”, Virtual MRS Spring/ Fall Meeting, Boston, United States (online). 2020.
2018
S. Van Aert, Fatermans, J., De Backer, A., van den Bos, K. H. W., O'Leary, C. M., Müller-Caspary, K., Jones, L., Lobato, I., Béché, A., den Dekker, A. J., Bals, S., and Nellist, P. D., “Maximising dose efficiency in quantitative STEM to reveal the 3D atomic structure of nanomaterials”, IMC19, Sydney, Australia. 2018.
2016
S. Van Aert, De Backer, A., Martinez, G. T., den Dekker, A. J., Van Dyck, D., Bals, S., and Van Tendeloo, G., “Advanced electron crystallography through model-based imaging”, IUCrJ, vol. 3, 2016.
D. Zanaga, Altantzis, T., Sanctorum, J., Freitag, B., and Bals, S., “An alternative approach for ζ-factor measurement using pure element nanoparticles”, Ultramicroscopy, vol. 164, pp. 11–16, 2016.
B. Goris, De Beenhouwer, J., De Backer, A., Zanaga, D., Batenburg, K. J., Sánchez-Iglesias, A., Liz-Marzán, L. M., Van Aert, S., Sijbers, J., Van Tendeloo, G., and Bals, S., “Investigating lattice strain in Au nanodecahedrons”, European Microscopy Congress 2016. 2016.
D. Zanaga, Bleichrodt, F., Altantzis, T., Winckelmans, N., Palenstijn, W. J., Sijbers, J., de Nijs, B., van Huis, M. A., Sánchez-Iglesias, A., Liz-Marzán, L. M., van Blaaderen, A., Batenburg, K. J., Bals, S., and Van Tendeloo, G., “Quantitative 3D analysis of huge nanoparticle assemblies.”, Nanoscale, vol. 8, no. 1, pp. 292-9, 2016.
2015
W. Van Aarle, Palenstijn, W. J., De Beenhouwer, J., Altantzis, T., Bals, S., Batenburg, K. J., and Sijbers, J., “The ASTRA Toolbox: a platform for advanced algorithm development in electron tomography”, Ultramicroscopy, vol. 157, pp. 35–47, 2015.PDF icon Download paper (3.47 MB)
B. Goris, De Beenhouwer, J., De Backer, A., Zanaga, D., Batenburg, K. J., Sánchez-Iglesias, A., Liz-Marzán, L. M., Van Aert, S., Bals, S., Sijbers, J., and Van Tendeloo, G., “Measuring Lattice Strain in Three Dimensions through Electron Microscopy”, Nano Letters, vol. 15, no. 10, pp. 6996–7001, 2015.
G. Van Eyndhoven, Kurttepeli, M., Van Oers, C. J., Cool, P., Bals, S., Batenburg, K. J., and Sijbers, J., “Pore REconstruction and Segmentation (PORES) method for improved porosity quantification of nanoporous materials”, Ultramicroscopy, vol. 148, pp. 10-19, 2015.
D. Zanaga, Bleichrodt, F., Altantzis, T., Winckelmans, N., Palenstijn, W. J., Sijbers, J., van Nijs, B., van Huis, M. A., van Blaaderen, A., Sánchez-Iglesias, A., Liz-Marzán, L. M., Batenburg, K. J., Bals, S., and Van Tendeloo, G., “Quantitative 3D analysis of huge nanoparticle assemblies”, Nanoscale, vol. 8, no. 1, pp. 292-299, 2015.
2014
G. Van Eyndhoven, Batenburg, K. J., Oers, C. V., Kurttepeli, M., Bals, S., Cool, P., and Sijbers, J., “Reliable Pore-size Measurements Based on a Procedure Specifically Designed for Electron Tomography Measurements of Nanoporous Samples”, International Congress on 3D Materials Science 2014 . 2014.
2013
B. Goris, Roelandts, T., Batenburg, K. J., Heidari Mezerji, H., and Bals, S., “Advanced reconstruction algorithms for electron tomography: from comparison to combination”, Ultramicroscopy, vol. 127, pp. 40–47, 2013.
2012
T. Roelandts, Batenburg, K. J., Biermans, E., Kubel, C., Bals, S., and Sijbers, J., “Accurate segmentation of dense nanoparticles by partially discrete electron tomography”, Ultramicroscopy, vol. 114, pp. 96-105, 2012.PDF icon Download paper (1.71 MB)
2011
K. J. Batenburg, Bals, S., Van Aert, S., Roelandts, T., and Sijbers, J., “Ultra-High Resolution Electron Tomography for Materials Science: A Roadmap”, Microscopy and Microanalysis 2011 Meeting. Nashville, TN, United States, 2011.
2010
T. Roelandts, Batenburg, K. J., Biermans, E., Bals, S., and Sijbers, J., “Partially Discrete Tomography for the Reconstruction of Dense Particles”, 17th International Microscopy Congress (IMC17). Rio de Janeiro, Brazil, p. I7.19, 2010.
2009
K. J. Batenburg, Bals, S., Sijbers, J., Kubel, C., Midgley, P. A., Hernandez, J. C., Kaiser, U., Encina, E. R., Coronado, E. A., and Van Tendeloo, G., “3D imaging of nanomaterials by discrete tomography”, Ultramicroscopy, vol. 109, pp. 730-740, 2009.
2007
S. Bals, Batenburg, K. J., Verbeeck, J., Sijbers, J., and Van Tendeloo, G., “Quantitative three-dimensional reconstruction of catalyst particles for bamboo-like carbon nanotubes”, Nano Letters, vol. 7, pp. 3669-3674, 2007.