Publications

Export 9 results:
Author Type [ Year(Desc)]
Filters: Author is Luc Van Hoorebeke  [Clear All Filters]
2015
V. Van Nieuwenhove, De Beenhouwer, J., De Schryver, T., Van Hoorebeke, L., and Sijbers, J., “Affine deformation correction in cone beam Computed Tomography”, in Fully Three-Dimensional Image Reconstruction in Radiology and Nuclear Medicine, Newport, Rhode Island, USA, 2015, pp. 182-185.
T. De Schryver, Dierick, M., Van Hoorebeke, L., Verboven, P., Van Dael, M., and Sijbers, J., “Tomography for in-line product inspection”, U.S. Patent EP3106863A12015.
2016
M. Van Dael, Verboven, P., Nicolai, B., Dhaene, J., Van Hoorebeke, L., and Sijbers, J., “Automated quality control and selection ”, U.S. Patent PCT/EP2016/0557182016.
M. Van Dael, Danckaers, F., De Schryver, T., Huysmans, T., Verboven, P., Van Hoorebeke, L., Sijbers, J., and Nicolai, B., “Combining 3D vision and X-ray radiography for internal quality inspection of foods”, 30th Targeted Technologies for Sustainable Food Systems (EFFoST) International Conference. Austrian Economic Chamber, Vienna, Austria, 2016.
T. De Schryver, Dhaene, J., Dierick, M., Boone, M. N., Janssens, E., Sijbers, J., Van Dael, M., Verboven, P., Nicolai, B., and Van Hoorebeke, L., “In-line NDT with X-Ray CT combining sample rotation and translation”, NDT & E International, vol. 89, pp. 89–98, 2016.
2017
M. Van Dael, Verboven, P., Van Hoorebeke, L., Sijbers, J., and Nicolai, B., “Comparison of methods for online inspection of apple internal quality”, in 7th Conference on Industrial Computed Tomography, Leuven, Belgium, 2017.PDF icon Download paper (815.39 KB)
V. Van Nieuwenhove, De Beenhouwer, J., De Schryver, T., Van Hoorebeke, L., and Sijbers, J., “Data-Driven Affine Deformation Estimation and Correction in Cone Beam Computed Tomography”, IEEE Transactions on Image Processing, vol. 26, no. 3, pp. 1441-1451, 2017.
M. Van Dael, Verboven, P., Dhaene, J., Van Hoorebeke, L., Sijbers, J., and Nicolai, B., “Multisensor X-ray inspection of internal defects in horticultural products”, Postharvest Biology and Technology, vol. 128, pp. 33–43, 2017.
2018
E. Janssens, De Beenhouwer, J., Van Dael, M., De Schryver, T., Van Hoorebeke, L., Verboven, P., Nicolai, B., and Sijbers, J., “Neural network Hilbert transform based filtered backprojection for fast inline X-ray inspection”, Measurement Science and Technology, vol. 29, no. 3, 2018.PDF icon Download paper (3.4 MB)