Publications

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2025
P. - J. Vanthienen, Francken, N., Sanctorum, J., Sijbers, J., and De Beenhouwer, J., “Gratings for multiresolution edge illumination X-ray phase contrast imaging: concept and simulation”, Optics Express, vol. 33, no. 8, pp. 17886-17902, 2025.
J. Deng, Meenaketan, B. Linkoon P., Takalloo, S. Ebrahimi, Chai, Y. Chin, Torfs, T., Braeken, D., De Beenhouwer, J., and Sijbers, J., “In-depth imaging of in-vitro tissue models using electrical impedance tomography”, in iCT 2025 - 14th Conference on Industrial Computed Tomography, 2025, vol. 4 - 7 February.
Y. Huybrechts, De Ridder, R., Bergen, D., De Samber, B., Boudin, E., Tonelli, F., Knapen, D., Vergauwen, L., Schepers, D., Van Dijck, E., Tong, Q., Verhulst, A., De Beenhouwer, J., Sijbers, J., Hammond, C., Forlino, A., Mortier, G., Coucke, P., P Witten, E., Kwon, R. Young, Willaert, A., Hendrickx, G., and Van Hul, W., “Loss of the Ubiquitin-Associated Domain of sqstm1/p62 in Zebrafish Causes a Phenotype Resembling Paget’s Disease of Bone”, Calcified Tissue International, vol. 116, no. 1, pp. 1-15, 2025.
J. Sanctorum, Sijbers, J., and De Beenhouwer, J., “Multi-contrast benchmarking of edge illumination Monte Carlo simulations using virtual gratings”, Journal of Applied Physics, vol. 137, no. 10, p. 104904, 2025.
J. De Beenhouwer and Sijbers, J., “A PHASE‑CONTRAST X‑RAY IMAGING SYSTEM FOR OBTAINING A DARK‑FIELD IMAGE AND A METHOD THEREFOR”, U.S. Patent EP 4 351 425 B12025.PDF icon Download patent (547.58 KB)
H. Le, Bossuyt, C., Escoda, J., Costin, M., De Beenhouwer, J., and Sijbers, J., “Proximal Neural Networks based reconstruction for few-view CT applications”, in 14th Conference on Industrial Computed Tomography (iCT), 4 - 7 February 2025, Antwerp, Belgium, 2025.PDF icon Download paper (4.27 MB)
M. Yosifov, Fröhler, B., Sijbers, J., De Beenhouwer, J., Kastner, J., and Heinzl, C., “Superimposing Synthetic Defects into Real XCT Data and Segmentation-Based Comparison for Advanced Probability of Detection Evaluation”, Journal of Nondestructive Evaluation , vol. 44, no. 119, 2025.
P. - J. Vanthienen, “Towards adaptive multi-resolution edge illumination X-ray phase contrast imaging”, 2025.
2026
M. Yosifov, “Advancement of Defect Detection and Quantifying Measurement Uncertainty in X-Ray CT Inspection”, 2026.
J. Sanctorum, “Advances in Monte Carlo simulations for the design of X-ray phase contrast imaging systems”, 2026.PDF icon Downloald thesis (17.67 MB)
J. Verstraete, Francken, N., Sijbers, J., and De Beenhouwer, J., “Cycloidal Acquisition for Inline Edge Illumination X-ray Phase Contrast Computed Tomography: A Simulation Study”, in 15th Conference on Industrial Computed Tomography (iCT), Linz, Austria, 2026, vol. 31.
B. Huyge, “Edge illumination phase contrast imaging with continuous motion”, 2026.
C. Bossuyt, den Dekker, A. J., Iuso, D., De Beenhouwer, J., and Sijbers, J., “Framework for optimal design of a multi-source rectangular X-ray cargo scanning system”, Radiation Physics and Chemistry, vol. 239, p. 113332, 2026.PDF icon Download paper (2.13 MB)
J. G. Sanctorum, De Samber, B., Paramonov, P., De Beenhouwer, J., and Sijbers, J., “GEO-ASTRA: a toolbox for non-conventional XCT scanning and reconstruction”, in 15th Conference on Industrial Computed Tomography (iCT), 10 - 13 February 2026, Linz, Austria (iCT 2026), e-Journal of Nondestructive Testing, 2026, vol. 31 (3).
J. Verstraete, Francken, N., Sijbers, J., and De Beenhouwer, J., “Inline Edge Illumination Computed Tomography: A Simulation Study”, in 2026 IEEE 23rd Mediterranean Electrotechnical Conference (MELECON), Cairo, Egypt, 2026.
M. Yosifov, Fernandes, T. Linhares, Zanini, F., Carmignato, S., De Beenhouwer, J., Sijbers, J., Kastner, J., and Heinzl, C., “Investigating the Influence of Individual Physical Effects on Dimensional Measurement Deviations Using XCT Simulations”, Measurement, vol. 263, no. 120168, 2026.
J. G. Sanctorum, Bekaert, N., Witteveen, W., Potters, G., Sijbers, J., and De Beenhouwer, J., “Towards X-ray-based inspection of corrosion in maritime infrastructure”, in 15th Conference on Industrial Computed Tomography (iCT), 10 - 13 February 2026, Linz, Austria (iCT 2026) Special Issue of e-Journal of Nondestructive Testing (eJNDT) ISSN 1435-4934 , 2026, vol. 31(3).

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