Publications

Export 178 results:
Author Type [ Year(Desc)]
Filters: Author is Jan De Beenhouwer  [Clear All Filters]
2025
M. Yosifov, Fröhler, B., Sijbers, J., De Beenhouwer, J., Kastner, J., and Heinzl, C., “Superimposing Synthetic Defects into Real XCT Data and Segmentation-Based Comparison for Advanced Probability of Detection Evaluation”, Journal of Nondestructive Evaluation , vol. 44, no. 119, 2025.
P. - J. Vanthienen, “Towards adaptive multi-resolution edge illumination X-ray phase contrast imaging”, 2025.
2026
C. Bossuyt, den Dekker, A. J., Iuso, D., De Beenhouwer, J., and Sijbers, J., “Framework for optimal design of a multi-source rectangular X-ray cargo scanning system”, Radiation Physics and Chemistry, vol. 239, p. 113332, 2026.PDF icon Download paper (2.13 MB)

Pages