Publications

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Author Type [ Year(Desc)]
Filters: Author is Jan De Beenhouwer  [Clear All Filters]
2025
M. Yosifov, Fröhler, B., Sijbers, J., De Beenhouwer, J., Kastner, J., and Heinzl, C., “Superimposing Synthetic Defects into Real XCT Data and Segmentation-Based Comparison for Advanced Probability of Detection Evaluation”, Journal of Nondestructive Evaluation , vol. 44, no. 119, 2025.
P. - J. Vanthienen, “Towards adaptive multi-resolution edge illumination X-ray phase contrast imaging”, 2025.
2026
C. Bossuyt, den Dekker, A. J., Iuso, D., De Beenhouwer, J., and Sijbers, J., “Framework for optimal design of a multi-source rectangular X-ray cargo scanning system”, Radiation Physics and Chemistry, vol. 239, p. 113332, 2026.PDF icon Download paper (2.13 MB)
M. Yosifov, Fernandes, T. Linhares, Zanini, F., Carmignato, S., De Beenhouwer, J., Sijbers, J., Kastner, J., and Heinzl, C., “Investigating the Influence of Individual Physical Effects on Dimensional Measurement Deviations Using XCT Simulations”, Measurement, vol. 263, no. 120168, 2026.

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