Publications

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Filters: Author is Pieter-Jan Vanthienen  [Clear All Filters]
Journal Article
N. Francken, Sanctorum, J., Sanctorum, J., Vanthienen, P. - J., Sijbers, J., and De Beenhouwer, J., “Inline edge illumination X-ray phase contrast imaging through mask misalignment”, Optics Express, vol. 32, no. 18, pp. 32048-32061, 2024.PDF icon Download paper (1.69 MB)
P. - J. Vanthienen, Sanctorum, J., Huyge, B., Six, N., Sijbers, J., and De Beenhouwer, J., “Grating designs for cone beam edge illumination X-ray phase contrast imaging: a simulation study”, Optics Express, vol. 31, no. 17, pp. 28051-28064, 2023.
B. Huyge, Vanthienen, P. - J., Six, N., Sijbers, J., and De Beenhouwer, J., “Adapting an XCT-scanner to enable edge illumination X-ray phase contrast imaging”, e-Journal of Nondestructive Testing, vol. 28, no. 3, 2023.
Conference Paper
P. - J. Vanthienen, Sanctorum, J., Huyge, B., Six, N., Sijbers, J., and De Beenhouwer, J., “Alternative grating designs for cone-beam edge illumination X-ray phase contrast imaging”, in Proc. SPIE 12242, Developments in X-Ray Tomography XIV, San Diego, USA, 2022, vol. 12242, p. 122420Z.