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Conference Abstract
S. Van Aert, De wael, A., Fatermans, J., Lobato, I., De Backer, A., Jones, L., den Dekker, A. J., and Nellist, P. D., Strategies for quantifying 3D atomic structures of nanomaterials and their dynamics using dose-efficient ADF STEM, PICO2019, Vaalsbroek, The Netherlands. 2019.
S. Van Aert, De wael, A., Fatermans, J., Lobato, I., De Backer, A., Jones, L., den Dekker, A. J., and Nellist, P. D., Quantifying 3D atomic structures of nanomaterials and their dynamics using model-based scanning transmission electron microscopy, Spring Meeting of the EMRS, Nice, France. 2019.
J. Fatermans, den Dekker, A. J., Müller-Caspary, K., Lobato, I., and Van Aert, S., The maximum a posteriori probability rule to detect single atoms from low signal-to-noise ratio scanning transmission electron microscopy images, IMC19, Sydney, Australia. 2018.
S. Van Aert, Fatermans, J., De Backer, A., van den Bos, K. H. W., O'Leary, C. M., Müller-Caspary, K., Jones, L., Lobato, I., Béché, A., den Dekker, A. J., Bals, S., and Nellist, P. D., Maximising dose efficiency in quantitative STEM to reveal the 3D atomic structure of nanomaterials, IMC19, Sydney, Australia. 2018.
J. Fatermans, Müller-Caspary, K., den Dekker, A. J., and Van Aert, S., Detection of atomic columns from noisy STEM images, Microscopy Conference 2017 (MC 2017), Lausanne, Switzerland. pp. 445-446, 2017.
J. Fatermans, Van Aert, S., and den Dekker, A. J., Bayesian model-order selection in electron microscopy to detect atomic columns in noisy images, RBSM 2016, Brussels, Belgium. p. 53, 2016.
J. Fatermans, den Dekker, A. J., Müller-Caspary, K., Lobato, I., and Van Aert, S., Bayesian analysis of noisy scanning transmission electron microscopy images for single atom detection, SCANDEM 2018, Technical University of Denmark, Kgs. Lyngby, Denmark. p. 95, 2018.
J. Fatermans, den Dekker, A. J., and Van Aert, S., Atom detection from electron microscopy images, RBSM 2019, Louvain-la-Neuve, Belgium. p. 15, 2019.
J. Fatermans, den Dekker, A. J., O'Leary, C. M., Nellist, P. D., and Van Aert, S., Atom column detection from STEM images using the maximum a posteriori probability rule, MC 2019, Berlin, Germany. 2019.