Publications

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M. Van Dael, Verboven, P., Dhaene, J., Van Hoorebeke, L., Sijbers, J., and Nicolai, B., Multisensor X-ray inspection of internal defects in horticultural products, Postharvest Biology and Technology, vol. 128, pp. 33–43, 2017.
E. Van de Casteele, Model-based approach for Beam Hardening Correction and Resolution Measurements in Microtomography, University of Antwerp, Antwerp, 2004.
E. Van de Casteele, Van Dyck, D., Sijbers, J., and Raman, E., An energy-based beam hardening model in tomography, Physics in Medicine and Biology, vol. 47, pp. 4181-4190, 2002.PDF icon Download full paper (203.21 KB)
E. Van de Casteele, Batenburg, K. J., Salmon, P., and Sijbers, J., Bone segmentation using discrete tomography, in Micro-CT User Meeting, 2011, pp. 178-183.PDF icon Download paper (107.53 KB)
E. Van de Casteele, Van Dyck, D., Sijbers, J., and Raman, E., Modelling of Beam hardening in micro CT, in IEEE International Symposium on Biomedical Imaging, Washington DC, USA, 2003, pp. 57-58.PDF icon Download full paper (163.52 KB)
E. Van de Casteele, Bugani, S., Camaiti, M., Morselli, L., and Janssens, K., X-ray microtomography as a non-destructive tool for stone characterization in a conservation study, in 4th ICNDT Hellenic Society, 2007.
E. Van de Casteele, Van Dyck, D., Sijbers, J., and Raman, E., A bimodal energy model for correcting beam hardening artefacts in X-ray tomography, in IEEE 29th Annual Northeast Bioengineering Conference2003 IEEE 29th Annual Proceedings of Bioengineering Conference, Newark, NJ, USA, 2003, pp. 57 - 58.
E. Van de Casteele, Bugani, S., Van Der Linden, A., and Janssens, K., X-ray microtomography as an imaging tool in cultural heritage, 9th International Conference on NDT of Art. 2008.
E. Van de Casteele, Van Dyck, D., Sijbers, J., and Raman, E., A model-based correction method for beam hardening artefacts in X-ray microtomography, Journal of X-ray science and technology, vol. 12, pp. 53-57, 2004.PDF icon Download full paper (632.04 KB)
E. Van de Casteele, Van Dyck, D., Sijbers, J., and Raman, E., The effect of beam hardening on MTF measurements in X-ray microtomography, in 19th Annual Symposium of the Belgian Hospital Physicists Association, 2004.
E. Van de Casteele, Van Dyck, D., Sijbers, J., and Raman, E., Effect of beam hardening on resolution in x-ray microtomography, in SPIE Medical Imaging: Image Processing, San Diego CA, USA, 2004, vol. 5370, pp. 2089-2096.PDF icon Download paper (156.85 KB)
E. Van de Casteele, Van Dyck, D., Sijbers, J., and Raman, E., A model-based correction method for beam-hardening artifacts in X-ray tomography, in 22nd Benelux Meeting on Systems and Control, Lommel, Belgium, 2003.
E. Van de Casteele, Parizel, P. M., and Sijbers, J., Quantitative evaluation of ASiR image quality: an adaptive statistical iterative reconstruction technique, in SPIE Medical Imaging, 2012, vol. 8313.PDF icon Download abstract (453.01 KB)
E. Van de Casteele, Perilli, E., Van Aarle, W., Reynolds, K., and Sijbers, J., Discrete tomography in an in vivo small animal bone study, Journal of Bone and Mineral Metabolism, vol. 36, no. 1, pp. 40–53, 2018.
T. Van De Looverbosch, Raeymaekers, E., Verboven, P., Sijbers, J., and Nicolai, B., Non-destructive internal disorder detection of Conference pears by semantic segmentation of X-ray CT scans using deep learning, Expert Systems with Applications, vol. 176, no. 114925, pp. 1-12, 2021.
T. Van De Looverbosch, Jiaqi, H., Tempelaere, A., Kelchtermans, K., Verboven, P., Tuytelaars, T., Sijbers, J., and Nicolai, B., Inline nondestructive internal disorder detection in pear fruit using explainable deep anomaly detection on X-ray images, Computers and Electronics in Agriculture, vol. 197, no. 106962, pp. 1-14, 2022.
T. Van De Looverbosch, Bhuiyan, H. Rahman, Verboven, P., Dierick, M., Van Loo, D., De Beenhouwer, J., Sijbers, J., and Nicolai, B., Nondestructive internal quality inspection of pear fruit by X-ray CT using machine learning, Food Control, vol. 113, no. 107170, pp. 1-13, 2020.
G. Van de Wouwer, Scheunders, P., and Van Dyck, D., Rotation-Invariant Texture Characterization using Isotropic Wavelet Frames, in Proc. ICPR98, International Conference on Pattern Recognition , Brisbane, Australia, 17-20 august, 1998, pp. 814-816.
G. Van de Wouwer, Vautrot, P., Scheunders, P., Livens, S., Van Dyck, D., and Bonnet, N., Rotation-invariant texture segmentation using continuous wavelets, in Proc. 2-nd IEEE Symposium on applications of time-frequency and time-scale methods , Coventry, UK, 27-29/9, 1997.
G. Van de Wouwer, Scheunders, P., Livens, S., and Van Dyck, D., Wavelet correlation signatures for color texture characterization, pattern Recognition, vol. 32, pp. 443-451, 1999.
G. Van de Wouwer and Scheunders, P., Wavelet-based texture classification, Recent Research in the Development of Pattern Recognition, vol. 1, pp. 77-87, 2000.
G. Van de Wouwer, Scheunders, P., and Van Dyck, D., Statistical texture characterization from discrete wavelet representations, IEEE Transactions on Image Processing, vol. 8, pp. 592-598, 1999.
G. Van de Wouwer, Scheunders, P., Van Dyck, D., Wuyts, F. L., and Van de Heyning, P. H., Voice classification by wavelet transforms and fuzzy interpreted LVQ networks, in Proceedings International Symposium on Soft Computing and Intelligent Industrial Automation, Reading, UK, March 26-28, 1996, pp. 171-177.
G. Van de Wouwer, Weyn, B., Scheunders, P., Jacob, W., Van Marck, E., and Van Dyck, D., Automated chromatin-texture based diagnosis of carcinoma nuclei, Journal of Microscopy, vol. 197, pp. 25-35, 2000.
G. Van de Wouwer, Scheunders, P., Van Dyck, D., Wuyts, F. L., and Van de Heyning, P. H., Voice recognition from spectrograms: a wavelet based approach, Fractals, vol. 5, pp. 165-172, 1997.

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