Publications

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Journal Article
B. Huyge, Renders, J., Sanctorum, J., De Beenhouwer, J., and Sijbers, J., “X-ray image reconstruction for continuous acquisitions with a generalized motion model”, Optics Express, vol. 32, no. 22, pp. 39192-39207, 2024.
P. - J. Vanthienen, Sanctorum, J., Huyge, B., Six, N., Sijbers, J., and De Beenhouwer, J., “Grating designs for cone beam edge illumination X-ray phase contrast imaging: a simulation study”, Optics Express, vol. 31, no. 17, pp. 28051-28064, 2023.
B. Huyge, Sanctorum, J., Jeurissen, B., De Beenhouwer, J., and Sijbers, J., “Fiber Orientation Estimation from X-ray Dark Field Images of Fiber Reinforced Polymers using Constrained Spherical Deconvolution”, Polymers, vol. 15, no. 13, p. 2887, 2023.PDF icon Download paper (2.95 MB)
N. Francken, Sanctorum, J., Huyge, B., Sijbers, J., and De Beenhouwer, J., “Efficient X-ray dark field contrast simulations using a condensed history approach”, Optics Express, vol. 33, no. 2, pp. 3562-3576, 2025.
Conference Paper
B. Huyge, Renders, J., De Beenhouwer, J., and Sijbers, J., “X-ray image reconstruction for continuous acquisition with accelerated rotation”, in SPIE Developments in X-Ray Tomography XV, 2024, vol. 13152.
B. Huyge, Jeurissen, B., De Beenhouwer, J., and Sijbers, J., “Fiber orientation estimation by constrained spherical deconvolution of the anisotropic edge illumination x-ray dark field signal”, in SPIE: Developments in X-Ray Tomography XIV, 2022, vol. 12242, p. 122420V .PDF icon Download paper (956.82 KB)
D. Gökbel Keklikoğlu, Francken, N., Huyge, B., Merdan, Z., De Beenhouwer, J., and Sijbers, J., “Dynamic flat field correction in edge illumination imaging”, in SPIE Developments in X-Ray Tomography XV, 2024, vol. 13152.
N. Francken, Sanctorum, J., Huyge, B., Sijbers, J., and De Beenhouwer, J., “Correcting for focal spot drift in edge illumination X-ray phase contrast imaging”, in 14th Conference on Industrial Computed Tomography (iCT), 4 - 7 February 2025, Antwerp, Belgium, 2025.
B. Huyge, Sanctorum, J., Six, N., De Beenhouwer, J., and Sijbers, J., “Analysis of flat fields in edge illumination phase contrast imaging”, in 2021 IEEE 18th International Symposium on Biomedical Imaging (ISBI), Nice, France, 2021, pp. 1310-1313.PDF icon Download paper (368.24 KB)
P. - J. Vanthienen, Sanctorum, J., Huyge, B., Six, N., Sijbers, J., and De Beenhouwer, J., “Alternative grating designs for cone-beam edge illumination X-ray phase contrast imaging”, in Proc. SPIE 12242, Developments in X-Ray Tomography XIV, San Diego, USA, 2022, vol. 12242, p. 122420Z.
B. Huyge, Vanthienen, P. - J., Six, N., Sijbers, J., and De Beenhouwer, J., “Adapting an XCT-scanner to enable edge illumination X-ray phase contrast imaging”, in e-Journal of Nondestructive Testing, 2023, vol. 28, no. 3.