Jan Sijbers

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B
C. Bossuyt, De Beenhouwer, J., and Sijbers, J., Optimization of a multi-source rectangular X-ray CT geometry for inline inspection, in SPIE Optical Engineering: Developments in X-Ray Tomography XIV , 2022, vol. 12242, p. 1224219 .
B
C. Bossuyt, De Beenhouwer, J., and Sijbers, J., Sparse view rectangular X-ray CT for cargo inspection using the ASTRA toolbox, 5th international Conference on Tomography of Materials & Structures, 27the June - 1ste July, Grenoble, France. 2022.
V
J. Van Houtte, Gao, X., Sijbers, J., and Zheng, G., 2D/3D registration with a statistical deformation model prior using deep learning, in the IEEE International Conference on Biomedical and Health Informatics (BHI'21) , 2021, pp. 1-4.PDF icon Download paper (1.41 MB)
H
B. Huyge, Sanctorum, J., Six, N., De Beenhouwer, J., and Sijbers, J., Analysis of flat fields in edge illumination phase contrast imaging, in 2021 IEEE 18th International Symposium on Biomedical Imaging (ISBI), Nice, France, 2021, pp. 1310-1313.PDF icon Download paper (368.24 KB)
P
A. Presenti, Liang, Z., Alves Pereira, L. F., Sijbers, J., and De Beenhouwer, J., CNN-based Pose Estimation of Manufactured Objects During Inline X-ray Inspection, in 2021 IEEE 6th International Forum on Research and Technology for Society and Industry (RTSI), 2021.
S
J. Sanctorum, Sijbers, J., and De Beenhouwer, J., Dark field sensitivity in single mask edge illumination lung imaging, in 2021 IEEE 18th International Symposium on Biomedical Imaging (ISBI), Nice, France, 2021, pp. 775-778.
P
R. Paolella, de la Rosa, E., Sima, D. M., Dive, D., Durand-Dubief, F., Sappey-Marinier, D., Jeurissen, B., Sijbers, J., and Billiet, T., Decoding Multiple Sclerosis EDSS disability scores from MRI using Deep Learning, 38th Annual Scientific Meeting Congress of the European Society for Magnetic Resonance in Medicine and Biology, vol. 34. pp. S57-S58, 2021.

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