Jan Sijbers

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N. Francken, Sanctorum, J., Huyge, B., Sijbers, J., and De Beenhouwer, J., Correcting for focal spot drift in edge illumination X-ray phase contrast imaging, in 14th Conference on Industrial Computed Tomography (iCT), 4 - 7 February 2025, Antwerp, Belgium, 2025.
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J. Van der Rauwelaert, Bossuyt, C., and Sijbers, J., Dual Domain Swin Transformer based Reconstruction method for Sparse-View Computed Tomography, in iCT 2025 - 14th Conference on Industrial Computed Tomography (iCT), 4 - 7 February 2025, Antwerp, Belgium, 2025.PDF icon Download paper (1.16 MB)
L
H. Le, Bossuyt, C., Escoda, J., Costin, M., De Beenhouwer, J., and Sijbers, J., Proximal Neural Networks based reconstruction for few-view CT applications, in 14th Conference on Industrial Computed Tomography (iCT), 4 - 7 February 2025, Antwerp, Belgium, 2025.PDF icon Download paper (4.27 MB)
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F. Linsen, Iuso, D., and Sijbers, J., Single X-ray Projection Material Decomposition using a Mesh Projector, in 14th Conference on Industrial Computed Tomography (iCT), 4 - 7 February 2025, Antwerp, Belgium (iCT 2025), 2025.PDF icon Download paper (857.7 KB)
J. Lüken, Fleischmann, C., Sijbers, J., and De Beenhouwer, J., AdAPTS: An Adaptive Atom Probe Tomography Simulation Library, Microscopy and Microanalysis, vol. 30, no. 1. 2024.
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P. Paramonov, Sanctorum, J. G., Iuso, D., Sijbers, J., and De Beenhouwer, J., High-resolution tiled X-ray cone-beam CT using the ASTRA toolbox, in 13th Conference on Industrial Computed Tomography (iCT) 2024, School of Engineering, Wels Campus, Austria, 2024.PDF icon Download paper (532.89 KB)

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