Jan Sijbers

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J. Verstraete, Francken, N., Sijbers, J., and De Beenhouwer, J., Inline Edge Illumination Computed Tomography: A Simulation Study, in 2026 IEEE 23rd Mediterranean Electrotechnical Conference (MELECON), Cairo, Egypt, 2026.
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N. Francken, Sanctorum, J., Huyge, B., Sijbers, J., and De Beenhouwer, J., Correcting for focal spot drift in edge illumination X-ray phase contrast imaging, in 14th Conference on Industrial Computed Tomography (iCT), 4 - 7 February 2025, Antwerp, Belgium, 2025.
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J. Van der Rauwelaert, Bossuyt, C., and Sijbers, J., Dual Domain Swin Transformer based Reconstruction method for Sparse-View Computed Tomography, in iCT 2025 - 14th Conference on Industrial Computed Tomography (iCT), 4 - 7 February 2025, Antwerp, Belgium, 2025.PDF icon Download paper (1.16 MB)

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