Publications

Export 785 results:
Author Type [ Year(Asc)]
Filters: First Letter Of Last Name is D  [Clear All Filters]
2022
M. Nicastro, Jeurissen, B., Beirinckx, Q., Smekens, C., Poot, D. H. J., Sijbers, J., and den Dekker, A. J., “To shift or to rotate? Comparison of acquisition strategies for multi-slice super-resolution magnetic resonance imaging”, Frontiers in Neuroscience, pp. 1-18, 2022.PDF icon Download paper (5.96 MB)
J. Sanctorum, Sijbers, J., and De Beenhouwer, J., “Virtual grating approach for Monte Carlo simulations of edge illumination-based x-ray phase contrast imaging”, Optics Express, vol. 31, no. 21, pp. 38695-38708, 2022.PDF icon Download paper (2.95 MB)
2021
S. Hosseinnejad, Bosch, E. G. T., Kohr, H., Lazić, I., Zharinov, V., Franken, E., Sijbers, J., and De Beenhouwer, J., “3D atomic resolution tomography from iDPC-STEM images using multiple atom model prior”, Microscopy Conference. 2021.PDF icon Download abstract (534.35 KB)
L. - P. Lumbeeck, Paramonov, P., Sijbers, J., and De Beenhouwer, J., “3D THz Tomography Incorporating the Beam Shape”, in 2021 OSA Imaging and Applied Optics Congress, 2021.
B. Shafieizargar, Jeurissen, B., Poot, D. H. J., Van Audekerke, J., Verhoye, M., den Dekker, A. J., and Sijbers, J., “Accelerated multi-shot diffusion weighted imaging with joint estimation of diffusion and phase parameters”, Magn Reson Mater Phy, vol. 34. pp. S57-S58, 2021.
J. Renders, Sijbers, J., and De Beenhouwer, J., “Adjoint image warping using multivariate splines with application to 4D-CT”, Medical Physics, vol. 48, no. 10, pp. 6362-6374, 2021.PDF icon Download paper (6.28 MB)
B. Huyge, Sanctorum, J., Six, N., De Beenhouwer, J., and Sijbers, J., “Analysis of flat fields in edge illumination phase contrast imaging”, in 2021 IEEE 18th International Symposium on Biomedical Imaging (ISBI), Nice, France, 2021, pp. 1310-1313.PDF icon Download paper (368.24 KB)
D. Iuso, Nazemi, E., Six, N., De Samber, B., De Beenhouwer, J., and Sijbers, J., “CAD-based scatter compensation for polychromatic reconstruction of additive manufactured parts”, in IEEE ICIP, 2021, pp. 2948-2952.
D. Iuso, Nazemi, E., Six, N., De Samber, B., De Beenhouwer, J., and Sijbers, J., “CAD-based scatter compensation for polychromatic reconstruction of additive manufactured parts”, in IEEE ICIP, 2021, pp. 2948-2952.
A. De Backer, Fatermans, J., den Dekker, A. J., and Van Aert, S., “Chapter Eight - General conclusions and future perspectives”, in Advances in Imaging and Electron Physics, vol. 217, Science Direct Elsevier, 2021.
A. De Backer, Fatermans, J., den Dekker, A. J., and Van Aert, S., “Chapter Eight - General conclusions and future perspectives”, in Advances in Imaging and Electron Physics, vol. 217, Science Direct Elsevier, 2021.
A. De Backer, Fatermans, J., den Dekker, A. J., and Van Aert, S., “Chapter Five - Optimal experiment design for nanoparticle atom counting from ADF STEM images”, in Advances in Imaging and Electron Physics, vol. 217, Science Direct Elsevier, 2021.
A. De Backer, Fatermans, J., den Dekker, A. J., and Van Aert, S., “Chapter Five - Optimal experiment design for nanoparticle atom counting from ADF STEM images”, in Advances in Imaging and Electron Physics, vol. 217, Science Direct Elsevier, 2021.
A. De Backer, Fatermans, J., den Dekker, A. J., and Van Aert, S., “Chapter Four - Atom counting”, in Advances in Imaging and Electron Physics,, vol. 217, Science Direct Elsevier, 2021.
A. De Backer, Fatermans, J., den Dekker, A. J., and Van Aert, S., “Chapter Four - Atom counting”, in Advances in Imaging and Electron Physics,, vol. 217, Science Direct Elsevier, 2021.
A. De Backer, Fatermans, J., den Dekker, A. J., and Van Aert, S., “Chapter One - Introduction”, in Advances in Imaging and Electron Physics, vol. 217, Science Direct Elsevier, 2021.
A. De Backer, Fatermans, J., den Dekker, A. J., and Van Aert, S., “Chapter One - Introduction”, in Advances in Imaging and Electron Physics, vol. 217, Science Direct Elsevier, 2021.
J. Fatermans, De Backer, A., den Dekker, A. J., and Van Aert, S., “Chapter Seven - Image-quality evaluation and model selection with maximum a posteriori probability”, in Advances in Imaging and Electron Physics, vol. 217, Science Direct Elsevier, 2021.
J. Fatermans, De Backer, A., den Dekker, A. J., and Van Aert, S., “Chapter Seven - Image-quality evaluation and model selection with maximum a posteriori probability”, in Advances in Imaging and Electron Physics, vol. 217, Science Direct Elsevier, 2021.
J. Fatermans, De Backer, A., den Dekker, A. J., and Van Aert, S., “Chapter Six - Atom column detection”, in Advances in Imaging and Electron Physics, vol. 217, Science Direct Elsevier, 2021.
J. Fatermans, De Backer, A., den Dekker, A. J., and Van Aert, S., “Chapter Six - Atom column detection”, in Advances in Imaging and Electron Physics, vol. 217, Science Direct Elsevier, 2021.
A. De Backer, Fatermans, J., den Dekker, A. J., and Van Aert, S., “Chapter Three - Efficient fitting algorithm”, in Advances in Imaging and Electron Physics, vol. 217, Science Direct Elsevier, 2021.
A. De Backer, Fatermans, J., den Dekker, A. J., and Van Aert, S., “Chapter Three - Efficient fitting algorithm”, in Advances in Imaging and Electron Physics, vol. 217, Science Direct Elsevier, 2021.
A. De Backer, Fatermans, J., den Dekker, A. J., and Van Aert, S., “Chapter Two - Statistical parameter estimation theory: principles and simulation studies”, in Advances in Imaging and Electron Physics, vol. 217, Science Direct Elsevier, 2021.
A. De Backer, Fatermans, J., den Dekker, A. J., and Van Aert, S., “Chapter Two - Statistical parameter estimation theory: principles and simulation studies”, in Advances in Imaging and Electron Physics, vol. 217, Science Direct Elsevier, 2021.

Pages