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2024
P. Paramonov, Sanctorum, J. G., Iuso, D., Sijbers, J., and De Beenhouwer, J., “High-resolution tiled X-ray cone-beam CT using the ASTRA toolbox”, in 13th Conference on Industrial Computed Tomography (iCT) 2024, School of Engineering, Wels Campus, Austria, 2024.PDF icon Download paper (532.89 KB)
J. Deng, Renders, J., Meenaketan, B. Linkoon P., Takalloo, S. Ebrahimi, Braeken, D., De Beenhouwer, J., and Sijbers, J., “Imaging Algorithm and Optimal Measurement Protocol for 3D Impedance Tomography on 2D High Density Micro Electrode Array”, IEEE Sensors, vol. 24, no. 15, pp. 24452-24465, 2024.
J. Deng, Renders, J., Meenaketan, B. Linkoon P., Takalloo, S. Ebrahimi, Braeken, D., De Beenhouwer, J., and Sijbers, J., “Imaging Algorithm and Optimal Measurement Protocol for 3D Impedance Tomography on 2D High Density Micro Electrode Array”, IEEE Sensors, vol. 24, no. 15, pp. 24452-24465, 2024.
J. Renders, “Improved 4DCT reconstruction algorithms for the imaging of foam microstructure formation”, 2024.PDF icon Download thesis (41.42 MB)
N. Six, “Improved X-ray CT reconstruction techniques with non-linear imaging models”, 2024.
N. Francken, De Beenhouwer, J., and Sijbers, J., “Inline edge illumination through sample mask misalignment: a proof of concept”, in Proceedings of the 6th International Conference on X-ray and Neutron Phase Imaging with Gratings, Shenzhen, China, 2024.PDF icon inline_edge_misalign_xnpig.pdf (209.25 KB)
N. Francken, Sanctorum, J., Sanctorum, J., Vanthienen, P. - J., Sijbers, J., and De Beenhouwer, J., “Inline edge illumination X-ray phase contrast imaging through mask misalignment”, Optics Express, vol. 32, no. 18, pp. 32048-32061, 2024.PDF icon Download paper (1.69 MB)
N. Six, Renders, J., De Beenhouwer, J., and Sijbers, J., “Joint multi-contrast CT for edge illumination X-ray phase contrast imaging using split Barzilai-Borwein steps”, Optics Express, vol. 32, no. 2, pp. 1135-1150, 2024.PDF icon Download paper (13.42 MB)
J. Sijbers and den Dekker, A. J., “Longitudinal Magnetic Resonance Imaging Method”, U.S. Patent WO2024100240A12024.
J. De Beenhouwer, Sijbers, J., and Vanthienen, P. - J., “Mask assembly for edge illumination phase contrast radiation imaging”, U.S. Patent EP2025062978W2024.PDF icon mask_patent.pdf (6.93 MB)
J. Sijbers, Danckaers, F., and Osstyn, J., “Methods and systems for determining an anatomical reconstruction of a broken bone”, 2024.
Q. Beirinckx, Bladt, P., van der Plas, M. C. E., van Osch, M. J. P., Jeurissen, B., den Dekker, A. J., and Sijbers, J., “Model-based super-resolution reconstruction for pseudo-continuous Arterial Spin Labeling”, NeuroImage, vol. 286, p. 120506, 2024.PDF icon Download paper (7.23 MB)PDF icon Download supplementary material (20.75 MB)
P. - J. Vanthienen, Francken, N., Sijbers, J., and De Beenhouwer, J., “Multi-resolution gratings for edge illumination x-ray phase contrast imaging: a simulation study”, in Developments in X-Ray Tomography XV, 2024, vol. 13152, p. 1315208.
D. Iuso, Paramonov, P., De Beenhouwer, J., and Sijbers, J., “PACS: Projection-driven with Adaptive CADs X-ray Scatter compensation for additive manufacturing inspection”, Precision Engineering, vol. 90, pp. 108-121, 2024.PDF icon Download paper (4.28 MB)
D. Iuso, Paramonov, P., De Beenhouwer, J., and Sijbers, J., “Practical multi-mesh registration for few-view poly-chromatic X-ray inspection”, Journal of Non-destructive Testing, vol. 43, 2024.PDF icon Download paper (6.94 MB)
A. - T. Nguyen, Renders, J., Sijbers, J., and De Beenhouwer, J., “Reconstruction with rigid motion correction technique in CT imaging: A simulation and application study”, Workshop on Scientific Computing and Applications. Vietnam Institute for Advanced Study in Mathematics (VIASM), Hanoi, Vietnam, 2024.PDF icon wsca2024.pdf (110.08 KB)PDF icon wsca2024_slides.pdf (2.75 MB)
J. Lüken, Fleischmann, C., Sijbers, J., and De Beenhouwer, J., “Simulating Atom Probe Tomography Using MFEM”, MFEM Community Workshop. 2024.
P. - J. Vanthienen, Sijbers, J., and De Beenhouwer, J., “A simulation study of optimized-aperture gratings for edge illumination cone-beam phase contrast x-ray imaging”, in Proceedings of the 6th International Conference on X-ray and Neutron Phase Imaging with Gratings, Shenzhen, China, 2024.Microsoft Office document icon proceeding_xnpig_pjvanthienen (165.5 KB)
J. Osstyn, Danckaers, F., Verstreken, A., Van Haver, A., Vanhees, M., and Sijbers, J., “Statistical shape model guided virtual reduction of displaced distal radius fractures”, in IEEE International Symposium on Biomedical Imaging, Athens, Greece, 2024, pp. 1-5.
J. Grammens, Van Haver, A., Danckaers, F., Vuylsteke, K., Sijbers, J., Mahluf, L., Angele, P., Kon, E., and Verdonk, P., “Three-dimensional bone morphology is a risk factor for medial postmeniscectomy syndrome: A retrospective cohort study”, Journal of Experimental Orthopaedics, vol. 11, no. 3, p. e12090, 2024.
D. Iuso, Chatterjee, S., Cornelissen, S., Verhees, D., De Beenhouwer, J., and Sijbers, J., “Voxel-wise segmentation for porosity investigation of additive manufactured parts with 3D unsupervised and (deeply) supervised neural models”, Applied Intelligence, vol. 54, pp. 13160–13177, 2024.PDF icon Download paper (2.48 MB)
B. Huyge, Renders, J., De Beenhouwer, J., and Sijbers, J., “X-ray image reconstruction for continuous acquisition with accelerated rotation”, in SPIE Developments in X-Ray Tomography XV, 2024, vol. 13152.
B. Huyge, Renders, J., Sanctorum, J., De Beenhouwer, J., and Sijbers, J., “X-ray image reconstruction for continuous acquisitions with a generalized motion model”, Optics Express, vol. 32, no. 22, pp. 39192-39207, 2024.
2023
B. Koirala, Das, S., Rasti, B., Ghamisi, P., Gloaguen, R., and Scheunders, P., “Acritical Comparison of Linear and Nonlinear Unmixing for Intimate Mixtures”, in 2023 13th Workshop on Hyperspectral Imaging and Signal Processing: Evolution in Remote Sensing (WHISPERS), 2023, pp. 1-5.PDF icon critical_comparison.pdf (1002.06 KB)
B. Huyge, Vanthienen, P. - J., Six, N., Sijbers, J., and De Beenhouwer, J., “Adapting an XCT-scanner to enable edge illumination X-ray phase contrast imaging”, in e-Journal of Nondestructive Testing, 2023, vol. 28, no. 3.

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