Publications

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Journal Article
G. Van Gompel, Van Slambrouck, K., Defrise, M., Batenburg, K. J., De Mey, J., Sijbers, J., and Nuyts, J., “Iterative correction of beam hardening artifacts in CT”, Medical Physics, vol. 38, pp. 36-49, 2011.
D. Pelt, Gursoy, D., Palenstijn, W. J., Sijbers, J., De Carlo, F., and Batenburg, K. J., “Integration of TomoPy and the ASTRA toolbox for advanced processing and reconstruction of tomographic synchrotron data”, Journal of Synchrotron Radiation, vol. 23, pp. 842-849, 2016.
K. J. Batenburg and Sijbers, J., “Generic iterative subset algorithms for discrete tomography”, Discrete Applied Mathematics, vol. 157, pp. 438-451, 2009.PDF icon Download paper (1.41 MB)
W. Van Aarle, Palenstijn, W. J., Cant, J., Janssens, E., Bleichrodt, F., Dabravolski, A., De Beenhouwer, J., Batenburg, K. J., and Sijbers, J., “Fast and Flexible X-ray Tomography Using the ASTRA Toolbox”, Optics Express, vol. 24, pp. 25129-25147, 2016.PDF icon Download paper (8.34 MB)
F. Bleichrodt, van Leeuwen, T., Palenstijn, W. J., Van Aarle, W., Sijbers, J., and Batenburg, K. J., “Easy implementation of advanced tomography algorithms using the ASTRA toolbox with Spot operators”, Numerical Algorithms, vol. 71, pp. 673-697, 2016.
A. Dabravolski, Batenburg, K. J., and Sijbers, J., “Dynamic Angle Selection in X-ray Computed Tomography”, Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, vol. 324, pp. 17-24, 2014.
K. J. Batenburg, Palenstijn, W. J., Balazs, P., and Sijbers, J., “Dynamic angle selection in binary tomography”, Computer Vision and Image Understanding, vol. 117, no. 5, pp. 306–318, 2013.PDF icon Download paper (2.71 MB)
W. J. Palenstijn, Bédorf, J., Sijbers, J., and Batenburg, K. J., “A distributed ASTRA Toolbox”, Advanced Structural and Chemical Imaging, vol. 2, no. 19, 2016.PDF icon Download paper (2.7 MB)
H. Segers, Palenstijn, W. J., Batenburg, K. J., and Sijbers, J., “Discrete Tomography in MRI: a Simulation Study”, Fundamenta Informaticae, vol. 125, no. 3-4, pp. 223-237, 2013.
K. J. Batenburg, Sijbers, J., Poulsen, H. F., and Knudsen, E., “DART: A Robust Algorithm for Fast Reconstruction of 3D Grain Maps”, Journal of Applied Crystallography, vol. 43, pp. 1464-1473, 2010.PDF icon Download paper (824.99 KB)
K. J. Batenburg and Sijbers, J., “DART: A practical reconstruction algorithm for discrete tomography”, IEEE Transactions on Image Processing, vol. 20, pp. 2542-2553, 2011.PDF icon Download paper (2.12 MB)
K. Zarei Zefreh, Van Aarle, W., Batenburg, K. J., and Sijbers, J., “DART: a new approach for super-resolution reconstruction of license plates”, Journal of Electronic Imaging, vol. 22, no. 4, 2013.PDF icon Download paper (2.03 MB)
Z. Mai, Hanel, R., Batenburg, K. J., Verhoye, M., Scheunders, P., and Sijbers, J., “Bias field reduction by localized Lloyd-Max quantization”, Magnetic Resonance Imaging, vol. 29, no. 4, pp. 536-545, 2011.
W. Van Aarle, Batenburg, K. J., and Sijbers, J., “Automatic parameter estimation for the Discrete Algebraic Reconstruction Technique (DART)”, IEEE Transactions on Image Processing, vol. 21, no. 11, pp. 4608-4621, 2012.PDF icon Download paper (3.91 MB)
W. Van Aarle, Palenstijn, W. J., De Beenhouwer, J., Altantzis, T., Bals, S., Batenburg, K. J., and Sijbers, J., “The ASTRA Toolbox: a platform for advanced algorithm development in electron tomography”, Ultramicroscopy, vol. 157, pp. 35–47, 2015.PDF icon Download paper (3.47 MB)
F. Bleichrodt, De Beenhouwer, J., Sijbers, J., and Batenburg, K. J., “Aligning Projection Images from Binary Volumes”, Fundamenta Informaticae, vol. 135, pp. 1-22, 2014.
P. Reischig, King, A., Nervo, L., Viganó, N., Guilhem, Y., Palenstijn, W. J., Batenburg, K. J., Preuss, M., and Ludwig, W., “Advances in X-ray diffraction contrast tomography: flexibility in the setup geometry and application to multiphase materials”, Journal of Applied Crystallography, vol. 46, no. 2, pp. 297 - 311, 2013.
K. J. Batenburg, De Carlo, F., Mancini, L., and Sijbers, J., “Advanced X-ray tomography: experiment, modeling, and algorithms”, Measurement Science and Technology, vol. 29, no. 8, p. 080101, 2018.
B. Goris, Roelandts, T., Batenburg, K. J., Heidari Mezerji, H., and Bals, S., “Advanced reconstruction algorithms for electron tomography: from comparison to combination”, Ultramicroscopy, vol. 127, pp. 40–47, 2013.
A. Dabravolski, Batenburg, K. J., and Sijbers, J., “Adaptive zooming in X-ray computed tomography”, Journal of X-Ray Science and Technology, vol. 22, pp. 77-89, 2014.PDF icon Download paper (3.75 MB)
K. J. Batenburg and Sijbers, J., “Adaptive thresholding of tomograms by projection distance minimization”, Pattern Recognition, vol. 42, pp. 2297-2305, 2009.PDF icon Download paper (1.05 MB)
T. Roelandts, Batenburg, K. J., Biermans, E., Kubel, C., Bals, S., and Sijbers, J., “Accurate segmentation of dense nanoparticles by partially discrete electron tomography”, Ultramicroscopy, vol. 114, pp. 96-105, 2012.PDF icon Download paper (1.71 MB)
K. J. Batenburg, Bals, S., Sijbers, J., Kubel, C., Midgley, P. A., Hernandez, J. C., Kaiser, U., Encina, E. R., Coronado, E. A., and Van Tendeloo, G., “3D imaging of nanomaterials by discrete tomography”, Ultramicroscopy, vol. 109, pp. 730-740, 2009.
Conference Paper
T. Roelandts, Batenburg, K. J., and Sijbers, J., “Visualizing the Segmentation Error of a Tomogram using the Residual Projection Error”, in The Second International Conference on Image Formation in X-Ray Computed Tomography (CT Meeting), Salt Lake City, UT, USA, 2012, pp. 293-296.
K. J. Batenburg and Sijbers, J., “Trabecular bone reconstruction from micro-CT data using discrete tomography”, in Proceedings of SPS-DARTS 2006 (The second annual IEEE BENELUX/DSP Valley Signal Processing Symposium), Antwerp, Belgium, 2006, pp. 65-69.

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