Publications

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2026
C. Bossuyt, den Dekker, A. J., Iuso, D., De Beenhouwer, J., and Sijbers, J., “Framework for optimal design of a multi-source rectangular X-ray cargo scanning system”, Radiation Physics and Chemistry, vol. 239, p. 113332, 2026.PDF icon Download paper (2.13 MB)
2025
N. Francken, Sanctorum, J., Huyge, B., Sijbers, J., and De Beenhouwer, J., “Correcting for focal spot drift in edge illumination X-ray phase contrast imaging”, in 14th Conference on Industrial Computed Tomography (iCT), 4 - 7 February 2025, Antwerp, Belgium, 2025.
J. Merckx, den Dekker, A. J., Sijbers, J., and De Beenhouwer, J., “DAMMER: Direct Adaptive Multi-resolution MEsh Reconstruction from X-ray measurements”, IEEE Transactions on Computational Imaging , vol. 11, pp. 926 - 941, 2025.
M. Yosifov, Lang, T., Florian, V., Gerth, S., De Beenhouwer, J., Sijbers, J., Kastner, J., and Heinzl, C., “Degradation Detection in Rice Products via Shape Variations in XCT Simulation-Empowered AI”, Journal of Nondestructive Evaluation, vol. 44, no. 10, 2025.
N. Francken, “Edge illumination X-ray phase contrast imaging: Advancements in simulations and inline acquisitions”, 2025.
B. Huyge, Francken, N., Sanctorum, J., Sanctorum, J., De Beenhouwer, J., and Sijbers, J., “Edge illumination X-ray phase contrast imaging with continuous mask motion”, Optics Express, vol. 33, no. 19, pp. 41271-41286, 2025.PDF icon Download paper (4.78 MB)
N. Francken, Sanctorum, J., Huyge, B., Sijbers, J., and De Beenhouwer, J., “Efficient X-ray dark field contrast simulations using a condensed history approach”, Optics Express, vol. 33, no. 2, pp. 3562-3576, 2025.
P. - J. Vanthienen, Francken, N., Sanctorum, J., Sijbers, J., and De Beenhouwer, J., “Gratings for multiresolution edge illumination X-ray phase contrast imaging: concept and simulation”, Optics Express, vol. 33, no. 8, pp. 17886-17902, 2025.
J. Deng, Meenaketan, B. Linkoon P., Takalloo, S. Ebrahimi, Chai, Y. Chin, Torfs, T., Braeken, D., De Beenhouwer, J., and Sijbers, J., “In-depth imaging of in-vitro tissue models using electrical impedance tomography”, in iCT 2025 - 14th Conference on Industrial Computed Tomography, 2025, vol. 4 - 7 February.
Y. Huybrechts, De Ridder, R., Bergen, D., De Samber, B., Boudin, E., Tonelli, F., Knapen, D., Vergauwen, L., Schepers, D., Van Dijck, E., Tong, Q., Verhulst, A., De Beenhouwer, J., Sijbers, J., Hammond, C., Forlino, A., Mortier, G., Coucke, P., P Witten, E., Kwon, R. Young, Willaert, A., Hendrickx, G., and Van Hul, W., “Loss of the Ubiquitin-Associated Domain of sqstm1/p62 in Zebrafish Causes a Phenotype Resembling Paget’s Disease of Bone”, Calcified Tissue International, vol. 116, no. 1, pp. 1-15, 2025.
J. Sanctorum, Sijbers, J., and De Beenhouwer, J., “Multi-contrast benchmarking of edge illumination Monte Carlo simulations using virtual gratings”, Journal of Applied Physics, vol. 137, no. 10, p. 104904, 2025.
J. De Beenhouwer and Sijbers, J., “A PHASE‑CONTRAST X‑RAY IMAGING SYSTEM FOR OBTAINING A DARK‑FIELD IMAGE AND A METHOD THEREFOR”, U.S. Patent EP 4 351 425 B12025.PDF icon Download patent (547.58 KB)
H. Le, Bossuyt, C., Escoda, J., Costin, M., De Beenhouwer, J., and Sijbers, J., “Proximal Neural Networks based reconstruction for few-view CT applications”, in 14th Conference on Industrial Computed Tomography (iCT), 4 - 7 February 2025, Antwerp, Belgium, 2025.PDF icon Download paper (4.27 MB)
M. Yosifov, Fröhler, B., Sijbers, J., De Beenhouwer, J., Kastner, J., and Heinzl, C., “Superimposing Synthetic Defects into Real XCT Data and Segmentation-Based Comparison for Advanced Probability of Detection Evaluation”, Journal of Nondestructive Evaluation , vol. 44, no. 119, 2025.
P. - J. Vanthienen, “Towards adaptive multi-resolution edge illumination X-ray phase contrast imaging”, 2025.
2024
L. - P. Lumbeeck, Paramonov, P., Sijbers, J., and De Beenhouwer, J., “About rapid phase-wrapping in terahertz phase contrast imaging”, in SPIE, 2024, vol. 13141, pp. 69-73.
J. Lüken, Fleischmann, C., Sijbers, J., and De Beenhouwer, J., “AdAPTS: An Adaptive Atom Probe Tomography Simulation Library”, Microscopy and Microanalysis, vol. 30, no. 1. 2024.
P. Paramonov, Francken, N., Renders, J., Iuso, D., Elberfeld, T., De Beenhouwer, J., and Sijbers, J., “CAD-ASTRA: A versatile and efficient mesh projector for X-ray tomography with the ASTRA-toolbox”, Optics Express, vol. 32, no. 3, pp. 3425-3439, 2024.PDF icon Download paper (11.29 MB)
L. - P. Lumbeeck, Paramonov, P., Sijbers, J., and De Beenhouwer, J., “Coherent detection terahertz imaging with a continuous wave source”, in SPIE, 2024, vol. 13141, pp. 63-68.
C. Bossuyt, den Dekker, A. J., Iuso, D., Le Hoang, T., Escoda, J., Costin, M., Sijbers, J., and De Beenhouwer, J., “Deep image prior for sparse-view reconstruction in static, rectangular multi-source x-ray CT systems for cargo scanning”, in SPIE Developments in X-Ray Tomography XV, 2024, vol. 13152.
J. Renders, Mancini, L., De Beenhouwer, J., and Sijbers, J., “Direct reconstruction of wet foam from sparse-view, dynamic X-ray CT scans”, Advanced Engineering Materials, vol. 2400957, pp. 1-10, 2024.PDF icon Download paper (2.77 MB)
D. Gökbel Keklikoğlu, Francken, N., Huyge, B., Merdan, Z., De Beenhouwer, J., and Sijbers, J., “Dynamic flat field correction in edge illumination imaging”, in SPIE Developments in X-Ray Tomography XV, 2024, vol. 13152.
N. Francken, Sanctorum, J., Paramonov, P., Sijbers, J., and De Beenhouwer, J., “Edge illumination x-ray phase contrast simulations using the CAD-ASTRA toolbox”, Optics Express, vol. 32, no. 6, pp. 10005-10021, 2024.
D. Iuso, “Ensuring Flawlessness in Additive Manufacturing: Advances in X-ray Inspection Techniques for Efficient Defect Detection”, 2024.PDF icon Download thesis (31.17 MB)
J. Merckx, den Dekker, A. J., De Beenhouwer, J., and Sijbers, J., “Fast and efficient tetrahedral volume mesh reconstruction with CAD-ASTRA”, in SPIE Developments in X-Ray Tomography XV, San Diego, USA, 2024, vol. 13152.

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