Publications

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2014
K. J. Batenburg, Palenstijn, W. J., and Sijbers, J., 3D imaging of semiconductor components by discrete laminography, in Stress induced phenomena and reliability in 3D microelectronics: AIP Conference Proceedings, 2014, vol. 1601, pp. 168-179.PDF icon Download paper (1.81 MB)
J. Cant, Palenstijn, W. J., Behiels, G., and Sijbers, J., Tomographic image reconstruction from continuous projections, in The third international conference on image formation in X-ray computed tomography, Salt Lake City, USA, 2014, pp. 295-298.PDF icon Download paper (2.38 MB)
2013
P. Reischig, King, A., Nervo, L., Viganó, N., Guilhem, Y., Palenstijn, W. J., Batenburg, K. J., Preuss, M., and Ludwig, W., Advances in X-ray diffraction contrast tomography: flexibility in the setup geometry and application to multiphase materials, Journal of Applied Crystallography, vol. 46, no. 2, pp. 297 - 311, 2013.
W. J. Palenstijn, Batenburg, K. J., and Sijbers, J., The ASTRA Tomography Toolbox, in 13th International Conference on Computational and Mathematical Methods in Science and Engineering, CMMSE 2013, 2013, vol. 4, pp. 1139-1145.PDF icon cmmse2013.pdf (174.19 KB)
H. Segers, Palenstijn, W. J., Batenburg, K. J., and Sijbers, J., Discrete Tomography in MRI: a proof of concept, Proc. Intl. Soc. Mag. Reson. Med, vol. 21. p. 2662, 2013.
H. Segers, Palenstijn, W. J., Batenburg, K. J., and Sijbers, J., Discrete Tomography in MRI: a Simulation Study, Fundamenta Informaticae, vol. 125, no. 3-4, pp. 223-237, 2013.
K. J. Batenburg, Palenstijn, W. J., Balazs, P., and Sijbers, J., Dynamic angle selection in binary tomography, Computer Vision and Image Understanding, vol. 117, no. 5, pp. 306–318, 2013.PDF icon Download paper (2.71 MB)
2010
K. J. Batenburg, Palenstijn, W. J., and Sijbers, J., Projection and backprojection in tomography: design choices and considerations, in Workshop on Applications of Discrete Geometry and Mathematical Morphology, 2010, pp. 106-110.PDF icon Download paper (367.34 KB)